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Transport delay and jitter measurements

  • US 20080080605A1
  • Filed: 09/28/2006
  • Published: 04/03/2008
  • Est. Priority Date: 09/28/2006
  • Status: Active Grant
First Claim
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1. A method of measurements comprising the steps of:

  • acquiring waveforms at two test points of a system under test;

    running constant clock recovery on both waveforms to obtain respective offset values;

    computing a time offset between the respective offset values;

    filtering jitter from the two test points;

    computing a mean-removed cross-correlation coefficient between the filtered jitter from the two test points; and

    computing a transport delay by summing the time offset and mean-removed cross-correlation coefficient.

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