Global predictive monitoring system for a manufacturing facility
First Claim
1. A global predictive monitoring system for a manufacturing facility, the system comprising:
- a plurality of individually separate and independent agents distributed on different computers in the manufacturing facility, each of the agents comprising a genetic algorithm and being configured to receive a set of inputs for calculating and outputting a risk value indicative of production yield; and
an agent response collector configured to receive outputs of the plurality of agents to generate a projection indicative of a health of production in the manufacturing facility.
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Accused Products
Abstract
A global predictive monitoring system for a manufacturing facility. The system may be employed in an integrated circuit (IC) device fabrication facility to monitor processing of semiconductor wafers. The system may include deployment of a swarm of individually separate agents running in computers in the facility. Each agent may comprise a genetic algorithm and use several neural networks for computation. Each agent may be configured to receive a limited set of inputs, such as defectivity data and WIP information, and calculate a risk from the inputs. A risk may be a value indicative of a production yield. Each agent may also generate a quality value indicative of a reliability of the risk value. New agents may be generated from the initial population of agents. Outputs from the agents may be collected and used to calculate projections indicative of a trend of the production yield.
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Citations
20 Claims
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1. A global predictive monitoring system for a manufacturing facility, the system comprising:
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a plurality of individually separate and independent agents distributed on different computers in the manufacturing facility, each of the agents comprising a genetic algorithm and being configured to receive a set of inputs for calculating and outputting a risk value indicative of production yield; and an agent response collector configured to receive outputs of the plurality of agents to generate a projection indicative of a health of production in the manufacturing facility. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A computer-implemented method of monitoring an IC device fabrication facility, the method comprising:
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creating an initial population of agents in the fabrication facility, each of the agents being configured to receive at least one input comprising data collected on a route of a wafer being processed in the fabrication facility, each of the agents generating a risk value indicative of production yield; creating new agents from agents in the initial population of agents to create a new population of agents; and generating a projection indicative of a trend of a production yield in the fabrication facility based on outputs from agents in the new population of agents. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A computer-implemented method of monitoring an IC device fabrication facility, the method comprising:
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running a plurality of individually separate and independent agents in computers in the fabrication facility, each agent in the plurality of agents being configured to receive a limited set of input data from the central database and calculate a first value indicative of a yield of a production process in the fabrication facility; and collecting outputs from the plurality of agents to generate a collected output; and performing statistical analysis on the collected output to determine a trend of the yield of the production process. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification