Method of calibrating a scanning system

• US 20080083127A1
• Filed: 11/27/2007
• Published: 04/10/2008
• Est. Priority Date: 12/16/2003
• Status: Active Grant

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: Somerville, Leo, McFarland, Geoffrey, Jonas, Kevyn, McMurtry, David
• Granted Patent: US 7,543,393 B2
• Time in Patent Office: Days
• US Class Current: 33/502
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence
• CPC Class Codes: G01B 21/045 Correction of measurements G01B9/02055 takes precedence

Abstract

A method of measuring an object using a surface sensing device mounted on a coordinate positioning apparatus. The method has the steps of measuring a single surface point of a feature of the object with the surface sensing device, moving the surface sensing device along a path around the feature at a fast speed, thereby taking measurements along the path, including at the surface point, determining the difference between the measurements of the surface point and using the difference determined to apply a correction to the object or subsequent objects having the same feature.

Claims

1. A method of measuring an object using a surface sensing device mounted on a coordinate positioning apparatus, the method comprising:

(a) measuring a single surface point of a feature of the object with the surface sensing device;

(b) moving the surface sensing device along a path around the feature at a fast speed, thereby taking measurements along the path, including at the surface point;

(c) determining the difference between the measurement of the surface point in step a) and in step b); and

(d) using the difference determined in step c) to apply a correction to the object or subsequent objects having the same feature.

2. A method according to claim 1 wherein the surface point is measured in step (a) at a slow speed.

3. A method according to claim 1 wherein the measurement of the surface point in step (a) is determined by taking multiple measurements of the surface point at different stylus deflections or probe forces and extrapolating the measurement data to that corresponding to zero stylus deflection or zero probe force.

4. A method according to claim 1 wherein the coordinate positioning apparatus comprises an articulating probe head which can rotate a surface sensing device about two or more axes and wherein the step of moving the surface sensing device along a path in step (b) is achieved by motion of the articulating probe head.

5. A method according to claim 4 wherein the feature has a centre line and wherein in step (b) the articulating probe head is positioned at the centre line.

6. A method according to claim 1 wherein the surface sending device is a measurement probe.

7. A method according to claim 6 wherein the measurement probe is a contact probe, having a workpiece contacting stylus which is deflectable from a rest position.

8. A method according to claim 6 wherein the measurement probe is a non contact probe.

9. Apparatus for measuring an object using a surface sensing device mounted on a coordinate positioning apparatus, the apparatus comprising a controller for carrying out the following steps:

(a) positioning the surface sensing device to measure a surface point of a feature of the object;

(b) moving the surface sensing device along a path around the feature at a fast speed, thereby taking measurements along the path, including at the surface point;

(c) determining the difference between the measurement of the surface point in step a) and in step b); and

(d) using the difference determined in step c) to apply a correction to the object or subsequent objects having the same feature.

10. Apparatus according to claim 9 wherein the surface point is measured in step (a) at a slow speed.

11. Apparatus according to claim 9 wherein the measurement of the surface point in step (a) is determined by taking multiple measurements of the surface point at different stylus deflections or probe forces and extrapolating the measurement data to that corresponding to zero stylus deflection or zero probe force.

12. Apparatus according to claim 9 wherein the coordinate positioning apparatus comprises an articulating probe head which can rotate a surface sensing device about two or more axes.

13. Apparatus according to claim 12 wherein the feature has a centre line and wherein in step (b) the articulating probe head is positioned at the centre line.

14. Apparatus according to claim 13 wherein the intersection of said two or more axes is positioned at the centre line.

15. Apparatus according to claim 9, wherein the surface sensing device is a measurement probe.

16. Apparatus according to claim 15 wherein the measurement probe is a contact probe, having a workpiece contacting stylus which is deflectable from a rest position.

17. Apparatus according to claim 15 wherein the measurement probe is a non contact probe.