Squib driver circuit diagnostic system and method

• US 20080086250A1
• Filed: 10/05/2006
• Published: 04/10/2008
• Est. Priority Date: 10/05/2006
• Status: Abandoned Application

• Current Assignee: Renesas Technology America Incorporated (Renesas Electronics Corporation)
• Original Assignee: Renesas Technology America Incorporated (Renesas Electronics Corporation)
• Inventors: Kuivenhoven, Robert
• Application Number:
  US11/544,912
• Publication Number:
  US 20080086250A1
• Time in Patent Office: Days
• US Class Current: 701/45
• CPC Class Codes: B60R 21/0173 Diagnostic or recording means therefor

Abstract

A squib driver module comprises a squib circuit for deploying a squib, e.g., in an airbag assembly, the squib circuit including a high side driver and a low side driver in combination for driving a firing signal to the squib; a circuit for activating the firing signal in response to a firing condition; squib diagnostic circuits for conducting diagnostic tests without activating the firing signal and without delivering a diagnostic signal equivalent of the firing signal to the squib, and for generating digital fault information based on the tests; registers for storing the fault information; logic for recognizing a fault condition based on the fault information; and a communication module for communicating the fault condition to a microprocessor unit. The squib diagnostic circuit may include node voltage diagnostic circuits, HSD and/or LSD open/short circuits, HSD and/or LSD driver fault diagnostic circuits, squib-squib short diagnostic circuits, and/or squib resistance diagnostic circuits.

Claims

1. A squib driver module comprising:

a squib circuit for deploying a squib, the squib circuit including a high side driver and a low side driver in combination for driving a firing signal to the squib;

a control circuit coupled to the squib circuit for activating the firing signal in response to a firing condition by sending an HSD control signal to the high side driver and an LSD control signal to the low side driver;

squib diagnostic circuits coupled to the high side driver and to the low side driver for conducting diagnostic tests without activating the firing signal to the squib and without delivering a diagnostic signal equivalent of the firing signal to the squib, the squib diagnostic circuits for generating digital fault information based on the diagnostic tests;

diagnostic registers for storing the digital fault information;

logic for recognizing a fault condition based on the digital fault information; and

a communication module for communicating the fault condition over a communication channel to a microprocessor unit.

2. The system of claim 1, wherein the squib is located in an airbag assembly.

3. The system of claim 1, wherein the high side driver includes a first transistor, the low side driver includes a second transistor, and the firing signal includes a firing current.

4. The system of claim 1, wherein the squib diagnostic circuits include a node voltage status diagnostic circuit for determining whether a node in the squib circuit is operating within a predetermined voltage range.

5. The system of claim 4, wherein the node voltage status diagnostic circuit is operative to determine whether a supply voltage coupled to the high side driver is operating within a predetermined supply voltage range.

6. The system of claim 1, wherein the squib diagnostic circuits include an HSD open/short diagnostic circuit for using a pull-down device to determine whether the high side driver has an open/short fault.

7. The system of claim 1, wherein the squib diagnostic circuits include an LSD open/short diagnostic circuit for using a pull-up device to determine whether the low side driver has an open/short fault.

8. The system of claim 1, wherein the squib diagnostic circuits include an HSD driver fault diagnostic circuit for disabling the low side driver, for providing a test signal to the high side driver to activate a diagnostic signal through the high side driver, the diagnostic signal being less than a minimum signal to deploy the squib, and for measuring a generated voltage to determine whether the high side driver is functioning properly.

9. The system of claim 8, wherein the squib driver module includes a second squib circuit for deploying a second squib, and squib diagnostic circuits include a squib-squib short diagnostic circuit for determining substantially simultaneously with the HSD driver fault diagnostic circuit whether a squib-squib short exists.

10. The system of claim 1, wherein the squib diagnostic circuits include an LSD driver fault diagnostic circuit for disabling the high side driver, for providing a test signal to the low side driver to activate a diagnostic signal through the low side driver, the diagnostic signal being less than a minimum signal to deploy the squib, and for measuring a generated voltage to determine whether the low side driver is functioning properly.

11. The system of claim 10, wherein the squib driver module includes a second squib circuit for deploying a second squib, and the squib diagnostic circuits include a squib-squib short diagnostic circuit for determining substantially simultaneously with the LSD driver fault diagnostic circuit whether a squib-squib short exists.

12. The system of claim 1, wherein the squib driver module includes a second squib circuit for deploying a second squib, and the squib diagnostic circuits include an HSD squib-squib short diagnostic circuit for disabling the low side driver, for providing a test signal to the high side driver to activate a diagnostic signal through the high side driver, and for comparing generated voltages at the first squib and the second squib to determine if a squib-squib short exists.

13. The system of claim 1, wherein the squib driver module includes a second squib circuit for deploying a second squib, and the squib diagnostic circuits include an LSD squib-squib short diagnostic circuit for disabling the high side driver, for providing a test signal to the low side driver to activate a diagnostic signal through the low side driver, and for comparing generated voltages at the first squib and the second squib to determine if a squib-squib short exists.

14. The system of claim 1, wherein the squib diagnostic circuits include a squib resistance diagnostic circuit for determining whether a squib resistance is within a predetermined squib resistance range.

15. The system of claim 1, wherein the communication module includes an SPI module.

16. The squib driver module of claim 1, wherein the logic and the communication module operate to automatically forward the fault condition to the microprocessor unit.

17. A method in a squib driver module, the method comprising:

determining whether a firing condition for deploying a squib has been satisfied;

if the firing condition has been satisfied,

causing a squib circuit to generate a firing signal to the squib; and

if the firing condition has not been satisfied,

initiating a squib diagnostic circuit coupled to the squib circuit to perform a diagnostic scan of the squib circuit;

generating by the squib diagnostic circuit digital diagnostic fault information indicative of a fault status;

storing the digital diagnostic fault information in a local register; and

sending the fault status to an external microprocessor unit at least if a fault is diagnosed.

18. The method of claim 17, wherein the determining whether the firing condition has been satisfied includes receiving an activation signal from a sensor and determining that the local register stores diagnostic fault information indicating no faults.

19. The method of claim 17, wherein the initiating occurs based on a trigger mode.

20. The method of claim 17, wherein the initiating occurs based on a free-running mode.

21. The method of claim 17, wherein the squib diagnostic circuit includes a node voltage status diagnostic circuit, and the generating includes determining whether a node in the squib circuit is operating within a predetermined voltage range.

22. The method of claim 21, wherein the node includes a supply voltage.

23. The method of claim 17, wherein the squib diagnostic circuit includes an open/short diagnostic circuit, and wherein the generating includes using a pull-down device to determine whether the squib circuit has an open/short fault.

24. The method of claim 23, wherein the squib diagnostic circuit includes an open/short diagnostic circuit, and the generating includes using a pull-up device to determine whether the squib circuit has an open/short fault.

25. The method of claim 17, wherein

the squib circuit includes a high side driver and a low side driver in combination for generating the firing signal,

the squib diagnostic circuit includes an HSD driver fault diagnostic circuit, and

the generating includes disabling the low side driver, providing a test signal to the high side driver to activate a diagnostic signal through the high side driver, the diagnostic signal being less than a minimum signal to deploy the squib, and measuring a generated voltage to determine whether the high side driver is functioning properly.

26. The method of claim 25, wherein the squib diagnostic circuit further includes a squib-squib short diagnostic circuit, and the generating further includes using the squib-squib short diagnostic circuit to determine substantially simultaneously with the HSD driver fault diagnostic circuit whether a squib-squib short exists.

27. The method of claim 17, wherein

the squib circuit includes a high side driver and a low side driver in combination for generating the firing signal,

the squib diagnostic circuit include an LSD driver fault diagnostic circuit, and

the generating includes disabling the high side driver, providing a test signal to the low side driver to activate a diagnostic signal through the low side driver, the diagnostic signal being less than a minimum signal to deploy the squib, and measuring a generated voltage to determine whether the low side driver is functioning properly.

28. The method of claim 17, wherein the squib diagnostic circuit further includes a squib-squib short diagnostic circuit, and the generating further includes using the squib-squib short diagnostic circuit to determine substantially simultaneously with the LSD driver fault diagnostic circuit whether a squib-squib short exists.

29. The method of claim 17, wherein

the squib circuit includes a high side driver and a low side driver in combination for generating the firing signal,

the squib diagnostic circuit includes an HSD squib-squib short diagnostic circuit, and

the generating includes disabling the low side driver, providing a test signal to the high side driver to activate a diagnostic signal through the high side driver, and comparing generated voltages at the squib and a second squib to determine if a squib-squib short exists.

30. The method of claim 17, wherein

the squib circuit includes a high side driver and a low side driver in combination for generating the firing signal,

the squib diagnostic circuit includes an LSD squib-squib short diagnostic circuit, and

the generating includes disabling the high side driver, providing a test signal to the low side driver to activate a diagnostic signal through the low side driver, and comparing generated voltages at the squib and a second squib to determine if a squib-squib short exists.

31. The method of claim 17, wherein the squib diagnostic circuit includes a squib resistance diagnostic circuit, and the generating includes determining whether a squib resistance is within a predetermined squib resistance range.

32. A squib driver module, comprising:

means for determining whether a firing condition for deploying a squib has been satisfied;

means for causing a squib circuit to generate a firing signal to the squib if the firing condition has been satisfied;

means for initiating a squib diagnostic circuit coupled to the squib circuit to perform a diagnostic scan of the squib circuit if the firing condition has not been satisfied, the squib diagnostic circuit for generating by the squib diagnostic circuit digital diagnostic fault information indicative of a fault status;

local register means for storing the digital diagnostic fault information; and

means for sending the fault status to an external microprocessor unit at least if a fault is diagnosed.

33. An electronic controller module, comprising:

a microprocessor unit;

a squib-controlled device including a squib;

a controller for recognizing a firing condition; and

a squib driver module coupled to the microprocessor unit and to the squib-controlled device, the squib driver module including

a squib circuit for deploying a squib, the squib circuit including a high side driver and a low side driver in combination for driving a firing signal to the squib;

a control circuit coupled to the squib circuit for activating the firing signal in response to a firing condition by sending an HSD control signal to the high side driver and an LSD control signal to the low side driver;

squib diagnostic circuits coupled to the high side driver and to the low side driver for conducting diagnostic tests without activating the firing signal to the squib and without delivering a diagnostic signal equivalent of the firing signal to the squib, the squib diagnostic circuits for generating digital fault information based on the diagnostic tests;

diagnostic registers for storing the digital fault information;

logic for recognizing a fault condition based on the digital fault information; and

a communication module for communicating the fault condition over a communication channel to a microprocessor unit.