MODEL-BASED TESTING METHOD AND SYSTEM USING EMBEDDED MODELS

• US 20080086668A1
• Filed: 10/05/2006
• Published: 04/10/2008
• Est. Priority Date: 10/05/2006
• Status: Abandoned Application

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Tufillaro, Nicholas B., Koche, Ajay, Jefferson, Stanley T.
• Application Number:
  US11/539,167
• Publication Number:
  US 20080086668A1
• Time in Patent Office: Days
• US Class Current: 714/741
• CPC Class Codes: G01R 31/2848 using simulation
• CPC Class Codes: G01R 31/3163 Functional testing
• CPC Class Codes: G01R 31/3167 Testing of combined analog and digital circuits testing ADC's H03M1/1071

Abstract

A testing system and various methods involving testing of a device under test (DUT) use a device model to model a stimulus-response behavior of a the DUT. The testing system includes a device model of the DUT that is fitted to the stimulus-response behavior of the DUT and a measurement projector connected to an output of the device model. The device model includes a block diagram model and a difference model. Test metrics for the DUT are produced by the measurement projector from an output of the fitted device model.

Claims

1. A model-based testing system comprising:

a device model that is fitted to a stimulus-response behavior of a device under test (DUT) to provide a fitted device model, the device model comprising a block diagram model and a difference model; and

a measurement projector producing test metrics for the DUT from an output of the fitted device model.

2. The model-based testing system of claim 1, further comprising:

a stimulus source that produces a stimulus signal, the stimulus source having an output connected to an input of the DUT and to an input of the device model,

wherein the DUT provides a response signal responsive to the stimulus signal, a combination of the stimulus signal and the response signal representing the stimulus-response behavior of the DUT.

3. The model-based testing system of claim 2, wherein the fitted device model comprises parameters of the device model adjusted to reduce a difference between a response of the device model to the stimulus signal and the response of the DUT to the stimulus signal, the parameters so adjusted being fitted parameters.

4. The model-based testing system of claim 1, wherein the block diagram model represents a signal path of a device type representative of the DUT.

5. The model-based testing system of claim 4, wherein a stimulus-response behavior of the block diagram model approximates a stimulus-response behavior of the device type such that frequency translations and signal gain features of the signal path are emulated.

6. The model-based testing system of claim 4, wherein the block diagram model comprises interconnected functional blocks, each functional block representing one or more functional elements of the signal path of the device type, wherein the interconnected functional blocks collectively exhibit a stimulus-response behavior that approximates the stimulus-response behavior of the device type at a block diagram level.

7. The model-based testing system of claim 6, wherein a functional block of the block diagram model represents a corresponding element of the device type as an ideal element.

8. The model-based testing system of claim 6, wherein a functional block of the block diagram model represents a corresponding element of the device type as an ideal element with a known impairment.

9. The model-based testing system of claim 4, wherein the block diagram model comprises a priori information regarding a structure of the signal path of the device type, the a priori information being block diagram-level information.

10. The model-based testing system of claim 1, wherein the difference model comprises a basis function and parameters associated with the basis function, the parameters being adjusted in the fitted device model, and wherein the difference model accounts for a difference between the stimulus-response behavior of the DUT and a stimulus-response behavior of the block diagram model.

11. The model-based testing system of claim 1, wherein the difference model comprises a nonlinear time-series analysis (NLTSA) model.

12. The model-based testing system of claim 1, wherein the measurement projector further produces skew lot results from the output of the fitted device model, the skew lot results representing a range of expected variations of the test metrics for a device type representative of the DUT.

13. The model-based testing system of claim 1, wherein the measurement projector further produces skew lot results from the output of the fitted device model, the skew lot results being used to improve the device model to better incorporate an effect of a parameter variation of a skew lot study.

14. The model-based testing system of claim 1, further comprising a testing protocol, the testing protocol defining a structure of the block diagram model and a structure of the difference model.

15. A method of model-based testing a device under test (DUT), the method comprising:

constructing a device model comprising a block diagram model and a difference model; and

determining test metrics for the DUT using measurement projection of an output of the device model,

wherein once constructed, a stimulus-response behavior of the device model essentially matches a stimulus-response behavior of the DUT.

16. The method of model-based testing of claim 15, wherein constructing a device model comprises:

generating the block diagram model of a device type from information regarding a block diagram-level structure of the signal path of the device type, the device type representing the DUT; and

generating the difference model comprising a basis function and model parameters, the difference model accounting for a difference between a stimulus-response behavior of the block diagram model and the stimulus-response behavior of the DUT.

17. The method of model-based testing of claim 15, wherein constructing a device model comprises:

measuring the stimulus-response behavior of the DUT; and

fitting the difference model, wherein fitting reduces a difference between the measured stimulus-response behavior of the DUT and the stimulus-response behavior of the device model.

18. The method of model-based testing of claim 17, wherein fitting the difference model comprises adjusting parameters of the difference model such that a response signal of the difference model essentially matches a response signal of the DUT.

19. The method of model-based testing of claim 15, wherein determining test metrics comprises:

stimulating the device model with one of a stimulus signal used in constructing a device model and another stimulus signal, such that stimulating the device model produces a response signal of the device model; and

performing measurement projection using the response signal to determine the test metrics.

20. The method of model-based testing of claim 15, further comprising performing a skew lot study of the device type using the device model, the skew lot study comprising:

introducing known variations into values of parameters in the device model; and

determining test metrics using measurement projection of the output of the device model.

21. A method of generating a model-based testing protocol, the method comprising:

developing a block diagram model of a device type, the block diagram model modeling a signal path of the device type and the device type representing a device under test (DUT);

developing a difference model comprising a basis function and model parameters, the difference model accounting for a difference between a stimulus-response behavior of the block diagram model and a stimulus-response behavior of the DUT; and

incorporating a device model into the testing protocol, the device model comprising the block diagram model and the difference model.

22. The method of generating of claim 21, further comprising:

defining a projection function for projecting test metrics for the DUT from an output of the device model; and

incorporating the projection function into the model-based testing protocol.

23. The method of generating of claim 21, further comprising verifying the device model.

24. The method of generating of claim 21, further comprising performing a skew lot study of the device type to one or both of define a tolerance for a test metric and improve the device model;

and

incorporating the tolerance into the model-based testing protocol.

25. The method of generating of claim 21, wherein developing the block diagram model comprises interconnecting functional blocks, the functional blocks modeling one or more elements of the device type signal path, wherein the interconnected functional blocks collectively exhibit the stimulus-response behavior of the block diagram model, the stimulus-response behavior of the block diagram model approximating the stimulus-response behavior of the device type at a block diagram level.

26. The method of generating of claim 21, wherein a functional block of the block diagram model models a corresponding element of the device type as an ideal element.

27. The method of generating of claim 21 used in model-based testing of the DUT, the model-based testing comprising:

receiving the testing protocol;

fitting the device model to the stimulus-response behavior of the DUT to produce a fitted device model; and

determining test metrics for the DUT from an output of the fitted device model.

28. A method of model-based testing a device under test (DUT), the method comprising:

receiving a testing protocol comprising a device model, the device model comprising a block diagram model and a difference model; and

fitting the device model to a stimulus-response behavior of the DUT to produce a fitted device model.

29. The method of model-based testing of claim 28, wherein fitting the device model comprises:

measuring the stimulus-response behavior of the DUT; and

adjusting parameters of the device model until a stimulus-response behavior of the device model essentially matches the measured stimulus-response behavior of the DUT.

30. The method of model-based testing of claim 28, the method further comprising:

determining test metrics for the DUT using measurement projection of an output of the fitted device model.

31. The method of model-based testing of claim 28, further comprising generating the testing protocol, wherein generating comprises:

developing a block diagram model of a device type representing the DUT, the block diagram model modeling a signal path of the device type;

developing a difference model comprising a basis function and model parameters, the difference model accounting for a difference between a stimulus-response behavior of the block diagram model and the stimulus-response behavior of the DUT; and

incorporating the block diagram model and the difference model into the testing protocol.