MODEL-BASED TESTING METHOD AND SYSTEM USING EMBEDDED MODELS
First Claim
Patent Images
1. A model-based testing system comprising:
- a device model that is fitted to a stimulus-response behavior of a device under test (DUT) to provide a fitted device model, the device model comprising a block diagram model and a difference model; and
a measurement projector producing test metrics for the DUT from an output of the fitted device model.
1 Assignment
0 Petitions
Accused Products
Abstract
A testing system and various methods involving testing of a device under test (DUT) use a device model to model a stimulus-response behavior of a the DUT. The testing system includes a device model of the DUT that is fitted to the stimulus-response behavior of the DUT and a measurement projector connected to an output of the device model. The device model includes a block diagram model and a difference model. Test metrics for the DUT are produced by the measurement projector from an output of the fitted device model.
-
Citations
31 Claims
-
1. A model-based testing system comprising:
-
a device model that is fitted to a stimulus-response behavior of a device under test (DUT) to provide a fitted device model, the device model comprising a block diagram model and a difference model; and a measurement projector producing test metrics for the DUT from an output of the fitted device model. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
-
-
15. A method of model-based testing a device under test (DUT), the method comprising:
-
constructing a device model comprising a block diagram model and a difference model; and determining test metrics for the DUT using measurement projection of an output of the device model, wherein once constructed, a stimulus-response behavior of the device model essentially matches a stimulus-response behavior of the DUT. - View Dependent Claims (16, 17, 18, 19, 20)
-
-
21. A method of generating a model-based testing protocol, the method comprising:
-
developing a block diagram model of a device type, the block diagram model modeling a signal path of the device type and the device type representing a device under test (DUT); developing a difference model comprising a basis function and model parameters, the difference model accounting for a difference between a stimulus-response behavior of the block diagram model and a stimulus-response behavior of the DUT; and incorporating a device model into the testing protocol, the device model comprising the block diagram model and the difference model. - View Dependent Claims (22, 23, 24, 25, 26, 27)
-
-
28. A method of model-based testing a device under test (DUT), the method comprising:
-
receiving a testing protocol comprising a device model, the device model comprising a block diagram model and a difference model; and fitting the device model to a stimulus-response behavior of the DUT to produce a fitted device model. - View Dependent Claims (29, 30, 31)
-
Specification