METHOD FOR IMPROVING DETAIL DETECTABILITY IN X-RAY IMAGES

• US 20080089479A1
• Filed: 10/10/2007
• Published: 04/17/2008
• Est. Priority Date: 10/10/2006
• Status: Active Grant

• Current Assignee: Smiths Heimann GmbH (Smiths Group International Holdings Ltd.)
• Original Assignee: Smiths Heimann GmbH (Smiths Group International Holdings Ltd.)
• Inventors: Henkel, Rainer
• Granted Patent: US 8,406,520 B2
• Time in Patent Office: Days
• US Class Current: 378/57
• CPC Class Codes: G01V 5/0008 Detecting hidden objects, e.g. weapons, explosives sorting of materials or articles according to radioactive properties B07C5/342; investigating or analysing materials by the use of wave or particle radiation G01N23/00
• CPC Class Codes: G01V 5/20 Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects

Abstract

A method for improving detail detectability in x-ray images is provided, whereby by means of an x-ray inspection device a positive x-ray image of an object is made, the x-ray image is subdivided into an object region and an empty region, and the empty region of the x-ray image is darkened.

Claims

1. A method for enhancing detail detectability in x-ray images, the method comprising:

providing, via an x-ray inspection device, a positive x-ray image of an object;

subdividing the x-ray image into an object region and an empty region; and

darkening the empty region of the x-ray image.

2. The method according to claim 1, wherein the darkening of the empty region is turned on by a viewer of the x-ray image.

3. The method according to claim 1, wherein the darkening of the empty region occurs automatically.

4. The method according to claim 1, wherein the degree of darkening is variable.

5. The method according to claim 1, wherein the object region and/or the empty region of the x-ray image is determined via image processing.

6. The method according to claim 1, wherein the object region and/or the empty region of the x-ray image is determined by sensors, photoelectric sensors or distance sensors.

7. The method according to claim 1, wherein the subdivision of the x-ray image into an object region and empty region occurs approximatively by rectangles.

8. The method according to claim 1, wherein a contour of the object is detected precisely and reproduced.

9. The method according to claim 8, wherein a clearance distance is provided between the determined contour of the object and a separation between the object region and empty region in the x-ray image.

10. An x-ray inspection system comprising:

an x-ray inspection device;

a display device for displaying a positive x-ray image of an object, the x-ray image being subdivided into an object region and an empty region; and

a device for determining and darkening an empty region of the x-ray image.

11. The inspection system according to claim 10, further comprising an actuating element for darkening of the empty region.

12. The x-ray inspection system according to claim 10, further comprising an actuating element for influencing a degree of darkening of the empty region.