Method and system for side-channel testing a computing device and for improving resistance of a computing device to side-channel attacks

• US 20080091975A1
• Filed: 10/13/2007
• Published: 04/17/2008
• Est. Priority Date: 10/17/2006
• Status: Abandoned Application

• Current Assignee: Konstantin Kladko, Yevgeniy Polulyakh
• Original Assignee: Konstantin Kladko, Yevgeniy Polulyakh
• Inventors: Kladko, Konstantin, Polulyakh, Yevgeniy
• Application Number:
  US11/974,445
• Publication Number:
  US 20080091975A1
• Time in Patent Office: Days
• US Class Current: 714/25
• CPC Class Codes: G06F 11/277 with comparison between actual response and known fault-free response

Abstract

Our invention presents an effective method and system which are used to perform side-channel testing of computing devices, as well as to improve resistance of computing devices against side-channel attacks.

Claims

1. A testing method for side-channel testing of computing devices, comprising the following steps. Step 1:

measuring one or several physical characteristics observed during execution of a particular operation or set of operations and denoting the result as the signature of the operation. Step 2;

Comparing the signatures to determine dependence of the signatures on the type of the operation and the parameters of the operation. Step 3;

If no significant dependency is found, concluding that the device is resistant against a side-channel attack, otherwise, concluding that the device is not resistant against a side-channel attack.

2. A testing method, as defined in claim 1, where the comparison is performed visually.

3. A testing method, as defined in claim 1, where the comparison is performed by defining and calculating mathematical metrics, such as absolute, based on the differences of measured signatures, or relative, where the absolute values are normalized by the overall amplitudes of the measured physical characteristics.

4. A testing method, as defined in claim 1, where the comparison is performed by defining a metric based on the maximum absolute difference of two power signatures matched in time, or on the maximum value of the integral over time of the absolute difference of two power signatures matched in time, or on the differences in peak counts, absolute and relative positions, heights, and areas under the peaks.

5. A testing method, as defined in claim 1, where multiple measurements are performed, and the signature is defined as an average of the multiple measurements.

6. A testing method, as defined in claim 1, where a representative subset of operations and parameter values is chosen, and the signatures are measured for the subset only.

7. A testing method, as defined in claim 1, where the computing device emits a synchronization signal, e.g., a signal at the beginning and/or end of an operation or a set of operations. This signal is used by the measurement device to synchronize measurement of a particular operation.

8. A testing method, as defined in claim 1, where the measured characteristic is power consumption of the device or related devices, or electromagnetic emission of the device or related devices, or a combination of power consumption and electromagnetic emission.

9. A testing method, as defined in claim 1, where one applies an external physical entity, such as electric or magnetic field, or radiation, or operates the device outside of its normal operating range and environment to amplify differences in measured signatures.

10. A system for side-channel testing of computing devices, comprising the following:

means to measure a physical characteristic or a set of characteristics of a computing device and/or its environment during execution of a particular operation, means to compare signatures and to measure or calculate a mathematical metric or a set of metrics to quantify the degree of similarity of signatures either for all operations and values of parameters or for a sample of operations and values of parameters.

11. A system, as defined in claim 10, which includes, in addition, means to read the synchronization signal emitted by the computing device and to use the signal to synchronize measurement of the signatures.

12. A system, as defined in claim 10, which includes, in addition, means to apply an external physical entity, such as electric or magnetic field, or radiation, or to operate the device outside of its normal operating range and environment in order to amplify differences in measured signatures.

13. A system, as defined in claim 10, where the physical characteristic measured is power consumption, electromagnetic emission, or combination of power consumption and electromagnetic emission.

14. A method to improve side-channel resistance of computing devices which comprises the following steps:

Step 1;

Measure side-channel resistance metrics using one of the embodiments of the method for side-channel testing of computing devices

Step 2;

Perform all, or some of the following steps

a) Improve side-channel resistance metrics by using the step

     1) repeatedly and changing the external and internal operating and design parameters of the device such as input voltage, clock signal amplitude or frequency, layout of internal electronic components to improve similarity of signatures and to optimize the side-channel resistance metric. Optimization in the space of parameters can either be done manually or automatically by using mathematical optimization techniques, such as the Newton method or the method of the steepest descent. Once the optimal values of the parameters have been found, modify the device design such that the device performs operations only if the parameters are in the optimal range. This can be done by adding environment sensors to the device. One may also optionally set different operating parameters for multiple instances of the same device, so that it becomes difficult to relate, signatures measured on two different instances of the same device.

b) Identify an “

unsafe”

set of operations and parameter values which lead to signatures with unsatisfactory values of side-channel resistance metrics. Modify the algorithm executed by the device or the implementation of the algorithm to minimize or preclude the use of operations from the unsafe set, and therefore to improve the overall side-channel resistance of the device.

c) Measure signatures for various pairs of operations A and B. If the signature of a particular operation A depends on the type or parameter values of another operation or set of operations B, such as the previous operation, the next operation, or an operation executed in parallel, vary the operation B to change the signature of operation A, so that it becomes more difficult to relate the measured signature to the type or parameters of the operation A. In particular add, delete or modify the operation B or its parameters in order to vary the signature of the operation A for the same value of parameters of the operation A. Perform variation of operation B either in a single device or across multiple instances of the same device so that it becomes difficult to relate signatures measured on two different instances of the same device.

d) Measure signatures for different states of the computing device. If the signature of a particular operation A depends on the state of the computing device, such as values of the registers, memory, program counter, internal ports and buses, then varying the state of the computing device can be used to change the signature of operation A, so that it becomes more difficult to relate the measured signature to the type and parameters of operation A. Perform variation of the state of the computing device either in a single device or across multiple instances of the same device so that it becomes difficult to relate signatures measured on two different instances of the same device.

e) Measure signatures varying the hardware design and layout of the device. If the signature of a particular operation A depends on the details of hardware design and layout of a particular device, introduce device variations in the hardware design and manufacturing process, to make two instances of the same device physically different so that it becomes difficult to relate signatures measured on two instances of the same device.

f) For a logical function or mathematical calculation executed by the device, identify alternative sequences of operations implementing this logical function or mathematical operation. Introduce variation of the alternative sequences so that it becomes more difficult to relate the measured signatures to the type or parameters of the logical function or mathematical calculation. Perform variation of the alternative sequences either in a single device or across multiple instances of the same device so that it becomes difficult to relate signatures measured on two different instances of the same device.