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SYSTEM FOR PATTERN RECOGNITION WITH Q-METRICS

  • US 20080101705A1
  • Filed: 10/31/2006
  • Published: 05/01/2008
  • Est. Priority Date: 10/31/2006
  • Status: Abandoned Application
First Claim
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1. A pattern recognition system comprising:

  • a configurable feature vector metric computer adapted to;

    receive a configuration parameter according to which said configurable feature vector metric computer is configured;

    receive a plurality of feature vectors representing measured subjects;

    compute one or more distances between said feature vectors using the configurable feature vector metric; and

    to output said one or more computed distances.

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