Resonant fourier scanning

• US 20080106777A1
• Filed: 11/03/2006
• Published: 05/08/2008
• Est. Priority Date: 11/03/2006
• Status: Active Grant

• Current Assignee: Ethicon Endo-Surgery, Inc. (Johnson & Johnson)
• Original Assignee: Ethicon Endo-Surgery, Inc. (Johnson & Johnson)
• Inventors: Weir, Michael P.
• Granted Patent: US 7,561,317 B2
• Time in Patent Office: Days
• US Class Current: 359/201
• CPC Class Codes: G02B 26/0833 the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD G02B26/0825 takes precedence; micromechanical devices in general B81B

Abstract

A scanning beam assembly comprising: a beam generator to generate a beam of radiation, and two or more oscillating reflectors configured to deflect the beam in sequence, each reflector being driven to contribute an incremental deflection of the beam so as to achieve a desired scanning beam waveform, at least one oscillating reflector aligned to receive the beam from the beam generator and deflect the beam to a second oscillating reflector, each oscillating reflector operating in a sinusoidal mode having a frequency and amplitude, and a controller for controlling the phase and/or frequency and/or amplitude of the oscillation of the reflectors so as to provide a desired scanning beam waveform.

Claims

1. In a scanning beam assembly comprising:

a beam generator to generate a beam of radiation, and

two or more oscillating reflectors configured to deflect the beam in sequence, each reflector being driven to contribute an incremental deflection of the beam so as to achieve a desired scanning beam waveform, at least one oscillating reflector aligned to receive the beam from the beam generator and deflect the beam to a second oscillating reflector, each oscillating reflector operating in a sinusoidal mode having a frequency and amplitude, and

a controller for controlling the phase and/or frequency and/or amplitude of the oscillation of the reflectors so as to provide a desired scanning beam waveform.

2. The scanning beam assembly of claim 1 wherein the resultant waveform is approximately linear for a portion of its period.

3. The scanning beam assembly of claim 1 wherein the at least two of the reflectors oscillate about substantially parallel axes.

4. The scanning beam assembly of claim 1 wherein one of the oscillating reflectors has a fundamental frequency of resonance and the other reflectors operate at odd harmonics of the fundamental resonance frequency.

5. The scanning beam assembly of claim 1 wherein the amplitude of a successive reflector'"'"'s deflection is the inverse square of the harmonic number.

6. The scanning beam assembly of claim 1 wherein the oscillating reflectors rotate about axes that are parallel and in a common plane and each oscillating reflector directs light to a fixed reflector which redirects the light sequentially to the next sinusoidally oscillating reflector.

7. The scanning beam assembly of claim 1 wherein the beam generator illuminates an optical fiber which transmits the beam to at least one of the reflectors.

8. The scanning beam assembly of claim 1 wherein the scanning beam assembly additionally includes at least one detector positioned to receive light reflected from the field of view.

9. The scanning beam assembly of claim 1 wherein the reflector includes a MEMS scanner.

10. The scanning beam assembly of claim 1 wherein the assembly includes a detector capable of generating a signal indicative of the position, frequency or amplitude of at least one reflector and the signal provides an output that is fed back to the controller to control the oscillation of at least one of the reflectors.

11. The scanning beam assembly of claim 1 wherein the controller is programmable with the desired waveform.

12. The scanning beam assembly of claim 11 wherein the controller performs a Fourier analysis based upon the desired waveform to control the oscillation of at least two oscillating reflectors.

13. The scanning beam assembly of claim 11 wherein the assembly includes a detector capable of generating a signal indicative of the position, frequency or amplitude of at least one reflector and the signal provides an output that is fed back to the controller to control the oscillation of at least one of the reflectors.

14. A scanned beam endoscope comprising:

an endoscope, and a scanning beam assembly including;

a beam generator to generate a beam of radiation, and

two or more oscillating reflectors configured to deflect the beam in sequence, each reflector being driven to contribute an incremental deflection of the beam so as to achieve a scanning beam waveform, at least one oscillating reflector aligned to receive the beam from the beam generator and deflect the beam to a second oscillating reflector, each oscillating reflector operating in a sinusoidal mode having a frequency and amplitude, and

a controller for controlling the frequency and/or amplitude an/or phase of the oscillation of the reflectors so as to provide a desired scanning beam waveform.

15. A scanning endoscope tip comprising:

a beam generator to generate a beam of radiation, and

two or more oscillating reflectors configured to deflect the beam in sequence, each reflector being driven to contribute an incremental deflection of the beam so as to achieve a scanning beam waveform, at least one oscillating reflector aligned to receive the beam from the beam generator and deflect the beam to a second oscillating reflector, each oscillating reflector operating in a sinusoidal mode having a frequency and amplitude, and

a controller for controlling the frequency and/or amplitude and/or phase of the oscillation of the reflectors so as to provide a desired scanning beam waveform.

16. The scanning endoscope tip of claim 15 wherein the at least two of the reflectors oscillate about substantially parallel axes.

17. The scanning endoscope tip of claim 15 wherein one of the oscillating reflectors has a fundamental frequency of resonance and the other reflectors operate at odd harmonics of the fundamental resonance frequency.

18. The scanning endoscope tip of claim 15 wherein the amplitude of a successive reflector'"'"'s deflection is the inverse square of the harmonic number.

19. The scanning endoscope tip of claim 15 wherein the oscillating reflectors rotate about axes that are parallel and in a common plane and each oscillating reflector directs light to a fixed reflector which redirects the light sequentially to the next sinusoidally oscillating reflector.

20. The scanning endoscope tip of claim 15 wherein the beam generator illuminates an optical fiber which transmits the beam to at least one of the reflectors.