Apparatus and method for controlling the propagation delay of a circuit by controlling the voltage applied to the circuit

• US 20080116964A1
• Filed: 11/22/2006
• Published: 05/22/2008
• Est. Priority Date: 11/22/2006
• Status: Abandoned Application

• Current Assignee: Exar Corporation (Maxlinear Incorporated)
• Original Assignee: Exar Corporation (Maxlinear Incorporated)
• Inventors: Caldwell, Michael W., Payseo-Diaz, Rafael, Kernahan, Kent, Zhou, Dongsheng, Spanoche, Sorin Andrei, Lambert, Craig Norman, Chen, Jingquan, Ribeiro, Milton D.
• Application Number:
  US11/604,165
• Publication Number:
  US 20080116964A1
• Time in Patent Office: Days
• US Class Current: 327/538
• CPC Class Codes: H03H 11/265 with adjustable delay
• CPC Class Codes: H03K 2005/00143 Avoiding variations of delay due to temperature
• CPC Class Codes: H03K 3/0315 Ring oscillators

Abstract

The voltage applied to an integrated circuit is controlled by a temporal process monitor formed as part of the integrated circuit. The temporal process monitor includes a voltage controlled oscillator for producing a first output signal having a first period. A comparator compares the first period to one or more reference values. Should the first period be greater than a first selected reference value the comparator sends a signal to increase the voltage being supplied to the integrated circuit. Should the first period be less than a second selected reference value, the comparator sends a signal to decrease the voltage applied to the integrated circuit. In some embodiments a scaling circuit is provided for producing a second output signal having a second period different from (typically but not necessarily longer than) the first period. By placing the temporal process monitor on an integrated circuit chip, process variations and environmental factors which affect the performance of the integrated circuit can be automatically compensated so that the integrated circuit performs within specifications. Two or more temporal process monitors can be placed on a single integrated circuit chip or on different integrated circuit chips and the longest period produced by the temporal process monitors can be used to control the voltage supplied to all the sections of the integrated circuit chip associated with the temporal process monitors or to all the integrated circuit chips associated with the temporal process monitors.

Claims

1. Structure for controlling the voltage applied to an integrated circuit which comprises:

a power supply;

an integrated circuit including a temporal process monitor formed as part of said integrated circuit;

a voltage controlled oscillator provided as part of said temporal process monitor for producing a first output signal having a first period; and

a comparator for comparing said first period to one or more reference values;

wherein said first period greater than a first selected reference value causes said comparator to send a signal to said power supply to increase the voltage being supplied to said integrated circuit and wherein said first period less than a second selected reference value causes said comparator to send a signal to said power supply to decrease the voltage applied to said integrated circuit.

2. Structure as in claim 1 wherein said first selected value and said second selected value are equal.

3. Structure as in claim 1 wherein said first selected value is greater than said second selected value.

4. Structure as in claim 1 further comprising:

means for deriving from said first output signal a second output signal having a second period larger than said first period; and

wherein said comparator compares said second period to one or more reference values.

5. Structure as in claim 4 wherein said second period greater than a first selected value causes said comparator to send a signal to said power supply to increase the voltage being supplied to said integrated circuit and wherein said second period less than a second selected value causes said comparator to send a signal to said power supply to decrease the voltage being supplied to said integrated circuit.

6. Structure as in claim 5 wherein said first selected value and said second selected value are equal.

7. Structure as in claim 5 wherein said first selected value is greater than said second selected value.

8. Structure as in claim 1 wherein said comparator comprises:

a microprocessor for receiving a digital indication of said first period and for comparing said first period to a reference period, said microprocessor generating a signal to increase the voltage being supplied by said power supply to said integrated circuit when said first period exceeds said reference value by at least a first selected amount and said microprocessor generating a signal to decrease the voltage being supplied by said power supply to said integrated circuit when said first period is beneath said reference value by at least a second selected amount.

9. The structure of claim 8 further comprising a temporal power converter comprising said microprocessor, a counter and an oscillator for producing an output signal at a selected frequency for use in driving said counter to count the units of time represented by said first period.

10. The structure of claim 8 further comprising:

means for scaling said output signal from said voltage controlled oscillator to provide a temporal control signal with a second period different from said first period.

11. The structure of claim 10 wherein said second period is longer than said first period.

12. The structure of claim 10 wherein said temporal process monitor further comprises a level shifter connected to shift the level of said first output signal.

13. The structure of claim 9 wherein said temporal power converter comprises:

means for comparing said first period to at least one reference value; and

means for adjusting the voltage supplied by said power supply to said integrated circuit as a function of the difference between said first period and said at least one reference value.

14. The structure of claim 1 further comprising:

means for scaling the output signal from said voltage controlled oscillator to provide a temporal control signal with a second period longer than said first period; and

means for changing during operation the means for scaling to provide for a different magnitude of change in the temporal control signal.

15. The structure of claim 14 wherein said temporal process monitor is on an integrated circuit chip the voltage applied to which is being controlled and said temporal power converter is also on said integrated circuit chip.

16. The structure of claim 14 wherein said temporal process monitor is on an integrated circuit chip the voltage applied to which is being controlled and said temporal power converter is not on said integrated circuit chip.

17. A plurality of structures each for controlling the voltage applied to at least a portion of an integrated circuit wherein:

each such structure comprises;

a temporal process monitor formed as part of an integrated circuit said temporal process monitor comprising;

a voltage controlled oscillator for producing a first output signal having a first period;

a divider for dividing said first output signal to produce a second output signal having a second period longer than said first period;

means for providing a first output signal from said temporal process monitor, said means for providing comprising two input leads and an output lead, one input lead carrying a first intermediate signal representing said second period, and the other input lead carrying a signal from a temporal process monitor in a preceding structure or a reference voltage if the structure containing said means for providing is the first structure in a series of said structures; and

an output lead from said means for providing, said output lead comprising one input lead to a means for providing in a next following temporal process monitor or, if the means for providing is in the last temporal process monitor in a series of such temporal process monitors, said output lead being connected to one or more pull-up transistors for pulling up the voltage on said output lead following a change of voltage on said output lead which indicates that all structures have completed the generation of a measure of the second period of the second output signal from the divider in each such temporal process monitor.

18. Structure as in claim 17 further comprising:

a comparator for comparing said second period to a reference period;

wherein said second period greater than a first selected value causes said comparator to send a signal to said power supply to increase the voltage being supplied to said integrated circuit and wherein a second period less than a second selected value causes said comparator to send a signal to said power supply to decrease the voltage being supplied to said integrated circuit.

19. Structure as in claim 18 wherein said first selected value is equal to said second selected value.

20. Structure as in claim 18, wherein said first selected value is greater than said second selected value.

21. Structure as in claim 17 wherein each temporal process monitor is on a separate integrated circuit chip.

22. Structure as in claim 17 wherein each temporal process monitor is on a different portion of a single integrated circuit chip.

23. Structure as in claim 20 wherein said first selected value and said second selected value are such as to provide a deadband between said first selected value and said second selected value within which no correction is made to the power being supplied to the integrated circuit.