VOLTAGE TEST CIRCUIT FOR COMPUTER POWER SUPPLY

• US 20080122477A1
• Filed: 10/10/2007
• Published: 05/29/2008
• Est. Priority Date: 11/27/2006
• Status: Active Grant

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: HO, YU-KUANG, GAN, XIAO-LIN, YUAN, ZHI-SHENG, XIAO, REN-JUN
• Granted Patent: US 7,930,579 B2
• Time in Patent Office: Days
• US Class Current: 324/771
• CPC Class Codes: G01R 31/40 Testing power supplies testing photovoltaic devices H02S50/10

Abstract

A voltage test circuit for testing a computer power supply includes a voltage input unit configured for receiving voltages from the computer power supply, a voltage output unit configured for outputting the voltages to a plurality of electrical loads, a test unit, a switch control unit, and a capacitive load module. The test unit is connected between the voltage input unit and the voltage output unit for testing output ripple and noise of the voltages. The capacitive load module includes a plurality of capacitive loads. The switch control unit is connected between the voltage input unit and the capacitive module for selecting a suitable capacitive load according to the computer power supply.

Claims

1. A voltage test circuit for testing a computer power supply, comprising:

a voltage input unit configured for receiving voltages from the computer power supply;

a voltage output unit configured for outputting the voltages to a plurality of electrical loads;

a test unit connected between the voltage input unit and the voltage output unit for testing output ripple and noise of the voltages;

a switch control unit; and

a capacitive load module having a plurality of capacitive loads, the switch control unit connected between the voltage input unit and the capacitive load module for selecting a suitable capacitive load according to the computer power supply.

2. The voltage test circuit as claimed in claim 1, wherein the voltage input unit comprises first˜

eighth connectors configured for simulating corresponding power interfaces of a motherboard, and an input switch configured for making the computer power supply power to the voltage test circuit, the voltage output unit comprises first˜

sixth outputs configured for respectively outputting a first output voltage +5 Vsb, a second output voltage +3.3V, a third output voltage −

12V, a fourth output voltage +12V1, a fifth output voltage +5V, and a sixth output voltage +12V2 corresponding to the computer power supply.

3. The voltage test circuit as claimed in claim 2, wherein the first connector is a twenty-four pin connector configured for simulating a main power interface of the motherboard, and comprises a pin connected to the first output, four pins connected to the second output, a pin connected to the third output, two pins connected to the fourth output, five pins connected to the fifth output, a switch pin connected to a terminal of the input switch, and a plurality of ground pins, the other terminal of the input switch is grounded.

4. The voltage test circuit as claimed in claim 3, wherein the second connector is a four-pin connector configured for simulating a power interface for supplying power to a CPU of the motherboard, and comprises two pins connected to the sixth output, and two ground pins connected to ground.

5. The voltage test circuit as claimed in claim 4, wherein the third, fourth, fifth, and six connectors are four-pin connectors configured for simulating power interfaces for supplying power to HDDs and CD drivers of the motherboard, the third and fourth connectors each include a pin connected the fourth output, the fifth and sixth connectors each include a pin connected the sixth output, the third, fourth, fifth, and sixth connectors each include two pins connected to ground, and a pin connected to the fifth output.

6. The voltage test circuit as claimed in claim 5, wherein the seventh connector is a six-pin connector configured for simulating power interfaces for supplying power to peripheral elements of the motherboard, and comprises three pins connected to the fourth output, other pins of the seventh connector are grounded.

7. The voltage test circuit as claimed in claim 6, wherein the eighth connector is an alternating current (AC) adapter connector, one terminal of the eighth connector is connected to the fourth output via the seventh connector, and the other terminal of the eighth connector is grounded.

8. The voltage test circuit as claimed in claim 2, wherein the test unit includes six porcelain capacitors, six electrolytic capacitors, and six test ports, each of the porcelain capacitors is connected in parallel with a corresponding electrolytic capacitor and a corresponding test port made of conductive metal sleeves, and then connected between the corresponding output and ground.

9. The voltage test circuit as claimed in claim 8, wherein the specification of the six porcelain capacitors are 25V/0.1 μ

F, the specification of the six electrolytic capacitors are 25V/10 μ

F.

10. The voltage test circuit as claimed in claim 2, wherein the switch control unit includes a first switch, a second switch, and a third switch, the first switch includes first˜

seventh sub-switches, one terminal of the first sub-switch is connected to the third output via the first connector, one terminal of the second sub-switch is connected to the first output via the first connector, one terminal of the third sub-switch is connected to the fourth output via the third connector, one terminal of the fourth sub-switch is connected to the fifth output via the first connector, one terminal of the fifth sub-switch is connected to the second output via the first connector, one terminal of the sixth sub-switch is connected to the fourth output via the first connector, one terminal of the seventh sub-switch is connected to the sixth output via the second connector, the second switch and third switch are single-pole double-throw (SPDT) switches, a pole of the second switch is connected to the other terminal of the first sub-switch, a pole of the third switch is connected to the other terminal of the fourth sub-switch, throws of the second and third switches are correspondingly connected to the capacitive load module.

11. The voltage test circuit as claimed in claim 10, wherein the capacitive load module includes first˜

eighth electrolytic capacitors, cathodes of the first and second electrolytic capacitors are connected together to a first throw of the second switch, the cathode of the third electrolytic capacitor is connected to a second throw of the second switch, anodes of the first, second and third electrolytic capacitors are grounded, the anode of the fourth electrolytic capacitor is connected to the other terminal of the second sub-switch of the first switch, the anode of the fifth electrolytic capacitor is connected to the other terminal of the third sub-switch of the first switch and a first throw of the third switch, the anode of the sixth electrolytic capacitor is connected to the other terminal of the fifth sub-switch of the first switch and a second throw of the third switch, the anode of the seventh electrolytic capacitor is connected to the other terminal of the sixth sub-switch of the first switch, the anode of the eighth electrolytic capacitor is connected to the other terminal of the seventh sub-switch of the first switch, cathodes of the fourth˜

eighth electrolytic capacitors are grounded.

12. The voltage test circuit as claimed in claim 11, wherein the specifications of the first, second, and fifth electrolytic capacitors are 25V/10000 μ

F, the specifications of the third and fourth electrolytic capacitors are 25V/330 μ

F, the specification of the sixth electrolytic capacitor is 16V/6000 μ

F, the specification of the seventh electrolytic capacitor is 25V/5000 μ

F, the specification of the eighth electrolytic capacitor is 25V/3000 μ

F.

13. A voltage test circuit for testing a computer power supply, comprising:

a voltage input unit configured for receiving voltages from the computer power supply, the voltage input unit comprising a plurality of connectors configured for simulating corresponding power interfaces of a motherboard, and an input switch configured for controlling the computer power supply supplying power to the voltage test circuit;

a voltage output unit comprising a plurality of outputs configured for respectively outputting the voltages to a plurality of electrical loads;

a test unit connected between the voltage input unit and the voltage output unit, the testing unit comprising a plurality of test ports made of conductive sleeve respectively connected to the outputs to allow a test tool being inserted into to test output ripple and noise of the voltages;

a capacitive load module having a plurality of capacitive loads; and

a switch control unit connected between the voltage input unit and the capacitive load module for selecting a suitable capacitive load according to the computer power supply.

14. The voltage test circuit as claimed in claim 13, wherein the test unit further comprises a plurality of porcelain capacitors and a plurality of electrolytic capacitors, and each of the porcelain capacitors is connected in parallel with a corresponding electrolytic capacitor and a corresponding test port, and then connected between the corresponding output and ground.

15. The voltage test circuit as claimed in claim 13, wherein the voltage input unit comprises first˜

eighth connectors, the first connector is a twenty-four pin connector configured for simulating a main power interface of the motherboard, the second connector is a four-pin connector configured for simulating a power interface for supplying power to a CPU of the motherboard, the third, fourth, fifth, and six connectors are four-pin connectors configured for simulating power interfaces for supplying power to HDDs and CD drivers of the motherboard, the seventh connector is a six-pin connector configured for simulating power interfaces for supplying power to peripheral elements of the motherboard, and the eighth connector is an alternating current (AC) adapter connector.