SEMICONDUCTOR APPARATUS
First Claim
1. A semiconductor apparatus comprising:
- a main circuit that includes at least one metal oxide semiconductor transistor and operates by receiving a supply of power supply voltage;
a plurality of sensor circuits that are arranged in the main circuit and detect local characteristic variations at each position of the sensor circuits as delay information;
an output interface circuit that collects detection results of the plurality of sensor circuits and outputs the collected results;
an arithmetic operating section that statistically processes the detection results of the plurality of sensor circuits outputted from the output interface circuit;
a power supply voltage controlling section that controls the power supply voltage supplied to the main circuit, based on the arithmetic operation result of the arithmetic operating section.
2 Assignments
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Accused Products
Abstract
A semiconductor apparatus that is effective for problems of local characteristic variations and that enables higher speed and lower power consumption. Semiconductor apparatus 100 has: a plurality of sensor circuits 101a to 101g which are arranged evenly inside semiconductor apparatus 100 and detect local characteristic variations at their respective positions as delay information; and output interface circuit 102 which collects delay information detected by a plurality of sensor circuits 101a to 101g and outputs the collected information to outside, and, in addition, externally, has: arithmetic operating section 110 which processes detected delay information statistically and generates a control code by judging conditions such as variations in the manufacturing process; output voltage controlling section 120 which determines the voltage to be outputted using a control code recorded in non-volatile memory 103; and power supply voltage generating section 130 which supplies power supply voltage 131a and ground potential 131b to semiconductor apparatus 100.
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Citations
26 Claims
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1. A semiconductor apparatus comprising:
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a main circuit that includes at least one metal oxide semiconductor transistor and operates by receiving a supply of power supply voltage; a plurality of sensor circuits that are arranged in the main circuit and detect local characteristic variations at each position of the sensor circuits as delay information; an output interface circuit that collects detection results of the plurality of sensor circuits and outputs the collected results; an arithmetic operating section that statistically processes the detection results of the plurality of sensor circuits outputted from the output interface circuit; a power supply voltage controlling section that controls the power supply voltage supplied to the main circuit, based on the arithmetic operation result of the arithmetic operating section. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification