Byte-Erasable Nonvolatile Memory Devices
First Claim
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1. A memory device, comprising:
- a semiconductor substrate including a first well of a first conductivity type and a second well of a second conductivity type, the second well being within the first well;
a memory cell array including a plurality of memory cells within the second well, the memory cell array including a first and a second group of byte number memory cells in a respective row of the memory cell array; and
a first and a second byte selection transistors in the first well and electrically coupled to first and second groups of byte number memory cells, respectively.
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Abstract
A nonvolatile memory device includes a semiconductor well region of first conductivity type on a semiconductor substrate and a common source diffusion region of second conductivity type extending in the semiconductor well region and forming a P-N rectifying junction therewith. A byte-erasable EEPROM memory array is provided in the semiconductor well region. This byte-erasable EEPROM memory array is configured to support independent erasure of first and second pluralities of EEPROM memory cells therein that are electrically connected to the common source diffusion region.
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Citations
21 Claims
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1. A memory device, comprising:
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a semiconductor substrate including a first well of a first conductivity type and a second well of a second conductivity type, the second well being within the first well; a memory cell array including a plurality of memory cells within the second well, the memory cell array including a first and a second group of byte number memory cells in a respective row of the memory cell array; and a first and a second byte selection transistors in the first well and electrically coupled to first and second groups of byte number memory cells, respectively. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A memory device, comprising:
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a first well in a semiconductor substrate; a second well within the first well; a memory cell array including a plurality of memory cells arranged in a row and a column, each of the memory cells including a first bit selection transistor of a first conductivity type, a memory cell transistor of the first conductivity type and a second bit selection transistor of the first conductivity type; and a plurality of byte selection transistors within the first well, each of the byte selection transistors being electrically connected to byte number memory cell transistors in a respective row of the memory cell array. - View Dependent Claims (9, 10, 11, 12, 13)
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14. A memory device, comprising:
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a first well of a first conductivity type in a substrate; a plurality of spaced apart second wells of a second conductivity type within the first well, each of the plurality of spaced apart second wells including a memory array including a plurality of memory cells arranged in a row and a column; and a first and a second byte selection transistors within the first well and both sides of each of the second wells, the first byte selection transistor and the second byte selection transistors being electrically coupled to first and second byte number memory cells of the same row of respective second well, respectively. - View Dependent Claims (15, 16, 17, 18)
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19. A memory device, comprising:
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a first well of a first conductivity in a substrate; a plurality of spaced apart second wells of a second conductivity type within the first well; a plurality of memory cells arranged in a row and a column, each of the plurality of memory cells including a memory cell transistor and a bit selection transistor serially connected in a column direction, a line width of the memory cell transistor and a line width of the bit section transistor are different from each other; and a byte selection transistor within the first well and electrically coupled to byte number memory cell transistors in a respective row. - View Dependent Claims (20, 21)
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Specification