Plasma Doping With Electronically Controllable Implant Angle
First Claim
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1. A plasma doping apparatus comprising:
- a) a chamber;
b) a plasma source that generates ions from a feed gas;
c) a platen positioned in the chamber adjacent to the plasma source, the platen supporting a wafer for plasma doping; and
d) a deflection grid comprising a first and second deflection electrode positioned in the chamber between the plasma source and the platen, the deflection grid deflecting ions with an angle that is proportional to a voltage difference between the first and the second deflection electrodes.
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Abstract
A plasma doping apparatus includes a chamber and a plasma source that generates ions from a dopant gas. A platen is positioned in the chamber adjacent to the plasma source that supports a wafer for plasma doping. A deflection grid comprising a first and second deflection electrode is positioned in the chamber between the plasma source and the platen. The deflection grid deflects ions with an angle that is proportional to a voltage difference between the first and the second deflection electrodes.
419 Citations
35 Claims
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1. A plasma doping apparatus comprising:
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a) a chamber; b) a plasma source that generates ions from a feed gas; c) a platen positioned in the chamber adjacent to the plasma source, the platen supporting a wafer for plasma doping; and d) a deflection grid comprising a first and second deflection electrode positioned in the chamber between the plasma source and the platen, the deflection grid deflecting ions with an angle that is proportional to a voltage difference between the first and the second deflection electrodes. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A plasma doping apparatus comprising:
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a) a chamber; b) a plasma source that generates ions from a feed gas; c) a platen positioned in the chamber adjacent to the plasma source, the platen supporting a wafer for plasma doping; and d) a deflection grid that is positioned in the chamber between the plasma source and the platen, the deflection grid comprising i. a top section that defines apertures for passing the ions from the plasma source through the deflection grid, the top section extracting ions from the plasma source at an energy that is proportional to a voltage applied to the top section; and ii. a first and second plurality of deflection electrodes that are biased at a first and second deflection voltage, respectively, the first and second plurality of deflection electrodes deflecting ions with an angle that is proportional to a voltage difference between the first and the second deflection voltage. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A method of plasma doping comprising:
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a) generating a plasma in a chamber from a dopant gas, the plasma containing dopant ions; b) biasing a deflection grid with a voltage that attracts the dopant ions from the plasma and directs the dopant ions through apertures in the deflection grid; and c) electrostatically deflecting the dopant ions traveling through the aperture at an angle that is determined by a voltage difference between two deflection electrodes so that the dopant ions impact a surface of a wafer at a non-normal angle of incidence. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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35. A method of performing multi-step plasma doping:
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a) generating a plasma in a chamber from a dopant gas, the plasma containing dopant ions; b) biasing a deflection grid with a voltage that attracts the dopant ions from the plasma and directs the dopant ions through apertures in the deflection grid; and c) generating a first voltage difference between two deflection electrodes for a first time period, the first voltage difference causing dopant ions to impact a surface of a wafer at a first non-normal angle of incidence for the first time period; and d) generating a second voltage difference between the two deflection electrodes for a second time period, the second voltage difference causing dopant ions to impact the surface of the wafer at a second non-normal angle of incidence during the second time period.
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Specification