COMPLEX EXPONENTIAL SMOOTHING FOR IDENTIFYING PATTERNS IN BUSINESS DATA
First Claim
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1. A system for detecting patterns, comprising:
- a monitor for capturing event values from an entity;
a running value calculation system for calculating a new running value based on a previous running value using complex exponential smoothing, wherein both the new running value and previous running value are complex numbers; and
an analysis system for recognizing patterns by analyzing the new running value.
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Abstract
A system, method and program product for detecting patterns. A system is provided that includes: a monitor for capturing event values from an entity; a running value calculation system that calculates a new running value based on a previous running value using complex exponential smoothing, wherein both the new running value and previous running value are complex numbers; and an analysis system for recognizing patterns by analyzing the new running value.
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Citations
21 Claims
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1. A system for detecting patterns, comprising:
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a monitor for capturing event values from an entity; a running value calculation system for calculating a new running value based on a previous running value using complex exponential smoothing, wherein both the new running value and previous running value are complex numbers; and an analysis system for recognizing patterns by analyzing the new running value. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A computer program product stored on a computer readable medium for detecting patterns, comprising:
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program code configured for capturing event values from an entity; program code configured for calculating a new running value based on a previous running value using complex exponential smoothing; and program code configured for recognizing patterns by analyzing at least one of a strength and a phase the new running value. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A method of detecting patterns in business event data, comprising:
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selecting a wavelength and wavelength number; capturing an event value;
calculating a new running value based on the event value, wavelength, wavelength number and a previous running value using complex exponential smoothing; andanalyzing the new running value to determine an existence of a pattern. - View Dependent Claims (16, 17, 18, 19, 20)
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21. A method for deploying pattern detection system, comprising:
providing a computer infrastructure being operable to; capture event values from an entity; calculate a new running value based on a previous running value using complex exponential smoothing; and search for patterns by analyzing at least one of a strength and a phase of the new running value.
Specification