SYSTEMS AND METHODS FOR PREDICTING FAILURE OF ELECTRONIC SYSTEMS AND ASSESSING LEVEL OF DEGRADATION AND REMAINING USEFUL LIFE
First Claim
1. A method for monitoring the health-state for electronic equipment, comprising:
- measuring current and voltage at an input and an output of the electronic equipment and acquiring data therefrom;
using the measured data, calculating performance metrics for the equipment;
separating the measured data into a plurality of data classes;
generating performance models for at least one data class;
extracting diagnostic features from measured data values by comparing calculated performance metrics with the diagnostic models; and
identifying the source and severity of a fault based upon the diagnostic features.
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Accused Products
Abstract
Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
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Citations
38 Claims
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1. A method for monitoring the health-state for electronic equipment, comprising:
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measuring current and voltage at an input and an output of the electronic equipment and acquiring data therefrom; using the measured data, calculating performance metrics for the equipment; separating the measured data into a plurality of data classes; generating performance models for at least one data class; extracting diagnostic features from measured data values by comparing calculated performance metrics with the diagnostic models; and identifying the source and severity of a fault based upon the diagnostic features. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method for employing a circuit having non-diagnostic functionality as a sensor, comprising:
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collecting, from the circuit, at least a first set of data relating to the non-diagnostic functionality when the circuit is operating in a fault-free mode; placing the circuit in an extreme environmental condition and collecting, from the circuit, at least a second set of data relating to the non-diagnostic functionality when the circuit is operating under the extreme environmental condition; using said first and second sets of data, modeling the operating state of at least one component in said circuit;
wherein the modeled operating state is relative to the non-diagnostic functionality; andduring operation of the circuit, generating respective electrical signals representative of the non-diagnostic functionality pursuant to the modeled operating state, and using the modeled operating state analyzing the electrical signals representative of the non-diagnostic functionality to identify when operation of the circuit has degraded. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22)
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23. A method for prediction of electronic system failures and useful life remaining, comprising:
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selecting at least one feature of the electronic system for monitoring, said feature being represented as a signal in the system; regularly monitoring the feature and storing the signal in real-time without interrupting the operation of the system; developing a model of the degradation of the system wherein the model includes the feature; and calculating, based upon the model and the stored signals, the remaining useful life of the system. - View Dependent Claims (24, 25, 26)
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27. A prognostic health management system for monitoring performance of an electronic system, comprising:
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a plurality of electronic circuit components, located in said electronic system, at least one component having a modeled operating state relative to at least one feature and generating respective electrical signals representative of the feature pursuant to the component operation; a data collection memory for storing samples of said electrical signals; and a computer processor, responsive to said electrical signals and the modeled operating state, for performing data analysis relative to the feature and detecting a variance in the operation of the component, wherein the processor further determines the health and/or remaining useful life of the component and the electronic system. - View Dependent Claims (28, 29, 30, 31, 32)
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33. A method for health monitoring and performance measurement of an electronic system, including:
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during operation of the system, generating electrical signals representative of non-diagnostic functionality pursuant to a modeled operating state for the system; using the modeled operating state, analyzing the electrical signals from the non-diagnostic functionality to identify when operation of the system has degraded; during operation of the system, generating signals representative of diagnostic functionality pursuant to a modeled operating state for the system; and using the modeled operating state, analyzing the electrical signals from the diagnostic functionality to identify when operation of the system has degraded. - View Dependent Claims (34, 35, 36, 37, 38)
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Specification