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Method for robust statistical semiconductor device modeling

  • US 20080141189A1
  • Filed: 12/08/2006
  • Published: 06/12/2008
  • Est. Priority Date: 12/08/2006
  • Status: Active Grant
First Claim
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1. A method for robust statistical semiconductor device modeling, said method comprising the steps of:

  • building a semiconductor device model using at least one new device parameter variation;

    constructing a variation library for said semiconductor device model;

    verifying said variation library against measured data from a physical semiconductor device.

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