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EMBEDDED SEMICONDUCTOR MEMORY DEVICES AND METHODS FOR FABRICATING THE SAME

  • US 20080145985A1
  • Filed: 10/11/2007
  • Published: 06/19/2008
  • Est. Priority Date: 12/15/2006
  • Status: Abandoned Application
First Claim
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1. A method for fabricating an embedded semiconductor memory device, comprising:

  • preparing a semiconductor substrate comprising region IA and region IB;

    forming gate dielectric layers and gate structures sequentially on the semiconductor substrate, with the gate dielectric layers in region IA being a charge trap region, and the gate dielectric layers in region IB being a non-charge trap region;

    forming source/drain extension regions in region IA and region IB; and

    forming source/drain regions in region IA and region IB, wherein upon application of a voltage to the gate structures, the respective source/drain regions are electrically connected through channels formed in the semiconductor substrate.

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