APPARATUS FOR MASS ANALYSIS OF IONS

• US 20080149825A1
• Filed: 12/10/2007
• Published: 06/26/2008
• Est. Priority Date: 12/14/2006
• Status: Abandoned Application

• Current Assignee: Tofwerk AG
• Original Assignee: Tofwerk AG
• Inventors: KOZLOVSKI, Viatcheslav Ivanovich, FUHRER, Katrin, GONIN, Marc
• Application Number:
  US11/953,442
• Publication Number:
  US 20080149825A1
• Time in Patent Office: Days
• US Class Current: 250/287
• CPC Class Codes: H01J 49/40 Time-of-flight spectrometers H01J49/36 takes precedence
• CPC Class Codes: H01J 49/4215 Quadrupole mass filters H01J49/4225 takes precedence

Abstract

An apparatus for mass analysis of ions comprises a high current ion source, in particular an ion source providing at least 5 million ions/s, preferably at least 50 million ions/s, at an output of the ion source, a time-of-flight mass spectrometer for analysis of ions transmitted from the ion source and a filter for segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions. The filter is coupled to the ion source and the filter and the time-of-flight mass spectrometer are arranged in such a way that the ions of the first group are transmitted to the mass spectrometer and that the ions of the second group are not transmitted to the mass spectrometer. Furthermore, the filter is designed in such a way that the second group consists of ions belonging to one or several narrow bands of m/q. The apparatus allows for analyzing minor compound ions generated by the high current ion source with good selectivity, undisturbed by major compounds.

Claims

1. An apparatus for mass analysis of ions comprising:

a high current ion source;

a time-of-flight mass spectrometer for analysis of ions transmitted from the high current ion source;

whereas the high current ion source as well as the time-of-flight mass spectrometer are particularly constituted and operated in such a way that a flux of ions generated by the high current ion source causes saturation effects in the time-of-flight mass spectrometer when the high current ion source is directly coupled to the time-of-flight mass spectrometer,

a filter for segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions, whereas the filter is coupled to the high current ion source and whereas the filter and the time-of-flight mass spectrometer are arranged in such a way that the first group of ions are transmitted to the mass spectrometer and that the second group of ions are not transmitted to the mass spectrometer;

whereas

the filter is designed in such a way that the second group of ions consists of ions belonging to one or several narrow bands of m/q.

2. The apparatus as recited in claim 1, wherein the time-of-flight mass spectrometer comprises an ADC ion detection system.

3. The apparatus as recited in claim 1, wherein the filter comprises a field generating device which is designed in such a way that it generates a primary confining field capable of transmitting ions towards the time-of-flight mass spectrometer as well as one or several RF fields superimposed with said primary confining field, whereas these RF frequencies match oscillation frequencies of ions belonging to said one or several narrow bands of m/q such that these ions are resonantly excited and finally ejected from a confining area of the primary confining field.

4. The apparatus as recited in claim 3, wherein the primary confining field is an RF multipole field.

5. The apparatus as recited in claim 4, wherein the primary confining field is an RF-only quadrupole field.

6. The apparatus as recited in claim 5, wherein the RF-only quadrupole field is 2-dimensional and trapping the ions in an area surrounding their main path towards the time-of-flight mass spectrometer.

7. The apparatus as recited in claim 6, wherein the field generating device is capable of generating a rotating quadrupole field.

8. The apparatus as recited in claim 3, wherein the field generating device further generates a coaxial linear field superimposed to the primary confining field in order to transport the incoming ions along an axis of said primary confining field.

9. The apparatus as recited in claim 3, wherein the field generating device is designed in such a way that different superimposed RF frequencies may be alternately generated such that several narrow bands of m/q are scanned and ions belonging to these bands are resonantly excited and ejected from the confining area of the primary confining field.

10. The apparatus as recited in claim 3, wherein the field generating device is designed in such a way that superimposed RF frequencies may be generated that are pulsed with a selectable pulse-width in order to selectively reduce an ion number of at least one of said narrow bands of m/q or in order to subsequently analyze different mass spectra by the time-of-flight mass spectrometer.

11. The apparatus as recited in claim 3, wherein the field generating device is designed in such a way that RF fields may be generated that suppress the second group of ions by a factor pl, where in particular 10⁻

4<

p_l<

0.1.

12. The apparatus as recited in claim 1, wherein a device for cooling the ions to be inserted into the filter, the device being designed in such a way that it generates a confining multipole field capable of transmitting ions towards the filter and that it holds a gaseous atmosphere filling a confining region of the confining multipole field.

13. The apparatus as recited in claim 1, wherein the high current ion source is a selective ion source for selectively ionizing particles to be analyzed and in that the selectively ionized particles are transmitted to the time-of-flight mass spectrometer.

23. The apparatus as recited in claim 1, wherein said high current ion source provides at least 5 million ions/s, preferably at least 50 million ions/s, at an output of said high current ion source.

14. A method for mass analysis of ions using in particular an ion source as well as a time-of-flight mass spectrometer that are constituted and operated in such a way that a flux of ions generated by the ion source would cause saturation effects in the time-of-flight mass spectrometer if the ion source were directly coupled to the time-of-flight mass spectrometer, comprising the steps of:

segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions;

transmitting the first group of ions to the time-of-flight mass spectrometer and discarding the second group of ions; and

segmenting the incoming ions in such a way that the second group of ions consists of ions belonging to one or several narrow bands of m/q.

15. The method as recited in claim 14, wherein for segmenting the incoming ions they are injected into a primary confining field capable of transmitting ions towards the time-of-flight mass spectrometer and being superimposed by one or several RF frequencies, whereas these RF frequencies are chosen in such a way as to match oscillation frequencies of ions belonging to said one or several narrow bands of m/q such that these ions are resonantly excited and finally ejected from a confining area of the primary confining field.

16. The method as recited in claim 15, wherein during the segmenting step the ions are subjected to a coaxial linear field superimposed to the primary confining field in order to be transported along an axis of said primary confining field towards the time-of-flight mass spectrometer.

17. The method as recited in claim 15, wherein different superimposed RF frequencies are alternately generated such that several narrow bands of m/q are scanned and ions belonging to these bands are resonantly excited and ejected from the confining area of the primary confining field.

18. The method as recited in claim 15, wherein superimposed RF frequencies are generated that are pulsed with a selectable pulse-width in order to selectively reduce an ion number of at least one of said narrow bands of m/q or in order to subsequently analyze different mass spectra by the time-of-flight mass spectrometer.

19. The method as recited in claim 14, wherein the ions are cooled before the segmenting step by injecting the ions into a gaseous atmosphere, and simultaneously subjecting the ions to a confining multipole field capable of transmitting ions towards a filter.

20. A method for mass analysis of particles, comprising the step of selectively ionizing particles to be analyzed as well as the method as recited in claim 14 for mass analysis of the selectively ionized particles.

21. The method as recited in claim 14, wherein the ions are stored in a confining multipole field, and RF ejection frequencies are applied during part or a total of a storage time of the ions.

22. The method as recited in claim 14, wherein the segmentation of the incoming ions is effected in such a way that the second group of ions are suppressed by a factor p_l, where in particular 10⁻

5<

p_l<

0.1, and where the method includes a calibration step, during which the factor p_l is evaluated in order to analyze quantitatively a yield of ions in the second group of ions.