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Analog boundary scanning based on stray capacitance

  • US 20080157782A1
  • Filed: 01/03/2007
  • Published: 07/03/2008
  • Est. Priority Date: 01/03/2007
  • Status: Active Grant
First Claim
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1. An integrated circuit capable of performing a boundary scan, comprising:

  • a plurality of pins; and

    an interface circuit connected to one of the plurality of pins, and configured to operate in;

    a boundary scan mode to obtain a signal indicative of a connection state of one or more external elements in relation to the pin, anda ordinary operation mode to perform functions related to an ordinary operation of the device, said functions being distinct from any boundary scan operations.

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