METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR CONCURRENT MODEL AIDED ELECTRONIC DESIGN AUTOMATION
First Claim
1. A machine-implemented method for predicting performance, manufacturability, or reliability (PMR) with concurrent model analysis, comprising:
- identifying an electronic circuit design for an electronic circuit to be manufactured by a first manufacturing process;
identifying a first concurrent model of the first manufacturing process for a first level of the electronic circuit;
determining a first geometric characteristic of a first feature of the first level based upon the first concurrent model;
determining a first metric of the first level based upon the first geometric characteristic of the first feature of the first level;
determining whether a first PMR requirement is satisfied for the electronic circuit based upon the first geometric characteristic or the first metric; and
displaying the first geometric characteristic of the first level or storing the first geometric characteristic in a tangible computer accessible medium.
1 Assignment
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Accused Products
Abstract
Disclosed are improved methods, systems, and computer program products for predicting performance, manufacturability, and reliability (PMR) using concurrent model analyses for electronic designs. Various embodiments of the present invention disclose a method for predicting PMR with concurrent process model analysis in which a method with concurrent model(s) generate a design for the one or more layers in the electronic circuit. The method then analyzes the impact of the processes or techniques for feature geometric characteristic predictions or PMR evaluations, based upon the concurrent models. Results may be reported to the users, or the method may modify the designs to accommodate the variations and determines one or more parameters based upon the concurrent models. One embodiment determines the impact of concurrent model on one or more of performance, manufacturability, and reliability criteria.
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Citations
24 Claims
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1. A machine-implemented method for predicting performance, manufacturability, or reliability (PMR) with concurrent model analysis, comprising:
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identifying an electronic circuit design for an electronic circuit to be manufactured by a first manufacturing process; identifying a first concurrent model of the first manufacturing process for a first level of the electronic circuit; determining a first geometric characteristic of a first feature of the first level based upon the first concurrent model; determining a first metric of the first level based upon the first geometric characteristic of the first feature of the first level; determining whether a first PMR requirement is satisfied for the electronic circuit based upon the first geometric characteristic or the first metric; and displaying the first geometric characteristic of the first level or storing the first geometric characteristic in a tangible computer accessible medium. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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23. A system for predicting performance, manufacturability, or reliability (PMR) with concurrent model analysis, comprising:
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means for identifying an electronic circuit design for an electronic circuit to be manufactured by a first manufacturing process; means for identifying a first concurrent model of the first manufacturing process for a first level of the electronic circuit; means for determining a first geometric characteristic of a first feature of the first level based upon the first concurrent model; means for determining a first metric of the first level based upon the first geometric characteristic of the first feature of the first level; means for determining whether a first PMR requirement is satisfied for the electronic circuit based upon the first geometric characteristic or the first metric; and means for displaying the first geometric characteristic of the first level or storing the first geometric characteristic in a tangible computer accessible medium.
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24. A computer program product comprising a computer-usable storage medium having executable code to execute a process for predicting performance, manufacturability, or reliability (PMR) with concurrent model analysis, comprising:
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identifying an electronic circuit design for an electronic circuit to be manufactured by a first manufacturing process; identifying a first concurrent model of the first manufacturing process for a first level of the electronic circuit; determining a first geometric characteristic of a first feature of the first level based upon the first concurrent model; determining a first metric of the first level based upon the first geometric characteristic of the first feature of the first level; determining whether a first PMR requirement is satisfied for the electronic circuit based upon the first geometric characteristic or the first metric; and displaying the first geometric characteristic of the first level or storing the first geometric characteristic in a tangible computer accessible medium.
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Specification