Force detector and acceleration detector and method of manufacturing the same

• US 20080178675A1
• Filed: 03/14/2008
• Published: 07/31/2008
• Est. Priority Date: 10/12/1990
• Status: Active Grant

• Current Assignee: Kazuhiro Okada
• Original Assignee: Kazuhiro Okada
• Inventors: Okada, Kazuhiro
• Granted Patent: US 7,533,582 B2
• Time in Patent Office: Days
• US Class Current: 73/514.32
• CPC Class Codes: G01L 1/144 with associated circuitry G01L1/146 and G01L1/148 take precedence
• CPC Class Codes: G01L 5/165 using variations in capacitance
• CPC Class Codes: G01L 5/167 using piezoelectric means
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/0922 of the bending or flexing mode type
• CPC Class Codes: G01P 15/105 by magnetically sensitive devices
• CPC Class Codes: G01P 15/125 by capacitive pick-up
• CPC Class Codes: G01P 15/18 in two or more dimensions
• CPC Class Codes: G01P 2015/084 the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass
• CPC Class Codes: Y10S 73/04 Piezoelectric
• CPC Class Codes: Y10T 29/43 Electric condenser making
• CPC Class Codes: Y10T 29/49005 Acoustic transducer
• CPC Class Codes: Y10T 29/49007 Indicating transducer

Abstract

An electrode layer is formed on the upper surface of a first substrate, and a processing for partially removing the substrate is carried out in order to allow the substrate to have flexibility. To the lower surface of the first substrate, a second substrate is connected. Then, by cutting the second substrate, a working body and a pedestal are formed. On the other hand, a groove is formed on a third substrate. An electrode layer is formed on the bottom surface of the groove. The third substrate is connected to the first substrate so that both the electrodes face to each other with a predetermined spacing therebetween. Finally, the first, second and third substrates are cut off every respective unit regions to form independent sensors, respectively. When an acceleration is exerted on the working body, the first substrate bends. As a result, the distance between both the electrodes changes. Thus, an acceleration exerted is detected by changes in an electrostatic capacitance between both the electrodes.

Claims

1. An acceleration detector detecting an X-axis component of an acceleration applied in an XYZ three-dimensional coordinate system, the detector comprising:

a displacement substrate extending along an XY-plane in the coordinate system,

a detector casing accommodating the displacement substrate, a periphery of the displacement substrate being supported by the detector casing so that the displacement substrate is caused to be displaced in the detector casing when an acceleration is applied,

displacement electrodes located on a surface of the displacement substrate,

fixed electrodes fixed to the detector casing and opposing to the displacement electrodes, respectively, so that capacitance elements are formed, each of said capacitance elements is constituted by a displacement electrode and an opposing fixed electrode,

a detecting circuit to detect the X-axis component based on a capacitance of a capacitance element among said capacitance elements, and

a testing circuit to exert a coulomb force between a displacement electrode and a fixed electrode constituting one of said capacitance elements so that a state equivalent to a state where an X-axis component of acceleration is applied can be created without actually applying an acceleration.

2. The acceleration detector as set forth in claim 1,

wherein the detecting circuit detects an X-axis component based on a difference between capacitance values of two capacitance elements, and the testing circuit exerts coulomb forces to two capacitance elements to create an equivalent state where an X-axis component of acceleration is applied.

3. The acceleration detector as set forth in claim 2,

wherein capacitance elements to which the testing circuit exerts coulomb forces and capacitance elements based on which the detecting circuit detects the X-axis component are different.

4. The acceleration detector as set forth in claim 1,

wherein the displacement substrate is constituted with a conductive material and the displacement electrodes are formed by portions of the conductive displacement substrate.

5. An acceleration detector detecting an X-axis component and a Y-axis component of an acceleration applied in an XYZ three-dimensional coordinate system, the detector comprising:

a displacement substrate extending along an XY-plane in the coordinate system,

a detector casing accommodating the displacement substrate, a periphery of the displacement substrate being supported by the detector casing so that the displacement substrate is caused to be displaced in the detector casing when an acceleration is applied,

displacement electrodes located on a surface of the displacement substrate,

fixed electrodes fixed to the detector casing and opposing to the displacement electrodes, respectively, so that capacitance elements are formed, each of said capacitance elements is constituted by a displacement electrode and an opposing fixed electrode,

a detecting circuit to detect the X-axis component based on a capacitance of a capacitance element among said capacitance elements and to detect the Y-axis component based on a capacitance of another capacitance element among said capacitance elements, and

a testing circuit to exert a coulomb force between a displacement electrode and a fixed electrode constituting one of said capacitance elements so that a state equivalent to a state where an X-axis component of acceleration is applied can be created without actually applying an acceleration and to exert a coulomb force between a displacement electrode and a fixed electrode constituting another one of said capacitance elements so that a state equivalent to a state where a Y-axis component of acceleration is applied can be created without actually applying an acceleration.

6. The acceleration detector as set forth in claim 5,

wherein the detecting circuit detects an X-axis component or a Y-axis component based on a difference between capacitance values of two capacitance elements, and the testing circuit exerts coulomb forces to two capacitance elements to create an equivalent state where an X-axis component or a Y-axis component of acceleration is applied.

7. The acceleration detector as set forth in claim 6,

wherein capacitance elements to which the testing circuit exerts coulomb forces and capacitance elements based on which the detecting circuit detects the X-axis component or the Y-axis component are different.

8. The acceleration detector as set forth in claim 5,

wherein the displacement substrate is constituted with a conductive material and the displacement electrodes are formed by portions of the conductive displacement substrate.