COMPACT SCANNED ELECTRON-BEAM X-RAY SOURCE

• US 20080198970A1
• Filed: 02/19/2008
• Published: 08/21/2008
• Est. Priority Date: 02/21/2007
• Status: Active Grant

• Current Assignee: L3 Technologies, Inc. (L3Harris Technologies, Inc.)
• Original Assignee: L-3 Communications Corporation (L3Harris Technologies, Inc.)
• Inventors: Wilsen, Craig Bisset, Kirshner, Mark Frederick, Kowalczyk, Richard Donald
• Granted Patent: US 7,639,785 B2
• Time in Patent Office: Days
• US Class Current: 378/137
• CPC Class Codes: G21K 1/093 by magnetic means
• CPC Class Codes: H01J 2235/086 Target geometry
• CPC Class Codes: H01J 2235/20 Arrangements for controlling gases within the X-ray tube
• CPC Class Codes: H01J 35/16 Vessels; Containers; Shields associated therewith
• CPC Class Codes: H01J 35/30 by deflection of the cathode ray

Abstract

A compact, reliable scanning electron-beam x-ray source achieves reduced complexity and cost. In particular, the x-ray source includes an electron beam that is propagated parallel to an x-ray target and is swept across the target in response to a moving magnetic cross field. Rather than scanning the beam by deflecting it about a single point, the point of deflection is translated along the target length, dramatically reducing the volume of the device. The magnetic cross field is translated along the target length using either mechanical systems to move permanent magnets, or electrical systems to energize an array of electromagnets.

Claims

1. An x-ray beam device comprising:

an electron gun adapted to generate an electron beam;

a drift tube comprising an input end, an output end, and an evacuated region, wherein the input end is operatively coupled to the electron gun, and the evacuated region is adapted to receive the electron beam from the electron gun;

a target situated along a length of the drift tube and extending in a direction substantially parallel to a direction of travel of the electron beam, wherein the target is adapted to emit x-rays when struck by the electron beam;

at least one bending magnet assembly situated adjacent to the drift tube wherein the at least one bending magnet assembly is adapted to selectively produce a magnetic field extending through the drift tube in a direction substantially perpendicular to the direction of travel of the electron beam to cause the electron beam to selectively bend and strike the target;

a collector operatively coupled to the output end of the drift tube and adapted to collect the electron beam when the at least one bending magnet assembly does not cause the electron beam to bend and strike the target; and

a controller adapted to control the at least one bending magnet assembly to cause the magnetic field extending through the drift tube to move along a length of the drift tube in at least one of a first direction from the electron gun to the collector and a second direction from the collector to the electron gun.

2. The x-ray beam device of claim 1, wherein the at least one bending magnet assembly comprises a permanent magnet and a carriage device adapted to mechanically support the permanent magnet, wherein the carriage device is further adapted to slide the permanent magnet along a length of the drift tube.

3. The x-ray beam device of claim 2, wherein the at least one bending magnet assembly further comprises a drive belt operatively connected to the carriage device and adapted to pull the carriage device along a length of the drift tube.

4. The x-ray beam device of claim 1, wherein the at least one bending magnet assembly comprises an electromagnet array.

5. The x-ray beam device of claim 4, wherein the controller is further adapted to selectively apply current to portions of the electromagnet array to cause the magnetic field extending through the drift tube to move along a length of the drift tube.

6. The x-ray beam device of claim 1, wherein the at least one bending magnet assembly comprises:

a rotating permanent magnet array comprising;

a central axle to which is affixed a plurality of permanent magnets, the plurality of permanent magnets configured to be non-collinear; and

a drum comprised of a magnetic shielding material and enclosing the plurality of permanent magnets wherein a top slot and a bottom slot are provided in the upper and lower surfaces of the drum; and

an array of upper and lower polepieces situated along the drift tube and adjacent to the rotating permanent magnet array such that the array of upper and lower polepieces is substantially aligned with the top slot and the bottom slot in the drum.

7. The x-ray beam device of claim 6, wherein the controller is further adapted to rotate the rotating permanent magnet array about the central axle such that when each of the plurality of permanent magnets reaches a vertical position in line with the top slot and the bottom slot in the drum, a magnetic circuit is completed with a corresponding element of the array of upper and lower polepieces.

8. The x-ray beam device of claim 1, wherein the at least one bending magnet assembly comprises:

an electromagnet;

an upper polepiece coupled to the electromagnet; and

a lower polepiece coupled to the electromagnet;

wherein the upper polepiece and the lower polepiece produce a magnetic field extending through the drift tube that varies in strength along a length of the drift tube.

9. The x-ray beam device of claim 8, wherein the controller is further adapted to control the amplitude of a current flowing through the electromagnet in order to control a location of a point within the drift tube at which the magnetic field extending through the drift tube is strong enough to bend the electron beam into the target.

10. The x-ray beam device of claim 1, wherein the at least one bending magnet assembly comprises:

an upper elongated magnet;

a lower elongated magnet; and

an axle operatively coupled to the upper elongated magnet and to the lower elongated magnet.

11. The x-ray beam device of claim 10, wherein the controller is further adapted to rotate the upper elongated magnet and the lower elongated magnet about the axle to selectively position the upper and lower elongated magnets adjacent to the drift tube in order to control a location of a point within the drift tube at which the magnetic field extending through the drift tube is strong enough to bend the electron beam into the target.

12. The x-ray beam device of claim 1, wherein the at least one bending magnet assembly comprises:

an array of magnets positioned along a length of the drift tube;

an array of saturable magnetic shunt elements positioned between the array of magnets and the drift tube;

a plurality of saturating switches operatively coupled to corresponding elements of the array of saturable magnetic shunt elements;

wherein, each element of the array of saturable magnetic shunt elements is adapted to shunt a magnetic field generated by the array of magnets when corresponding ones of the plurality of saturating switches are opened and to pass the magnetic field when corresponding ones of the plurality of saturating switches are closed.

13. The x-ray beam device of claim 12, wherein the controller is further adapted to selectively open and close ones of the plurality of saturating switches in order to selectively shield and expose portions of the drift tube to a magnetic field produced by the array of magnets positioned along a length of the drift tube.

14. In an x-ray beam device comprising an x-ray target, a drift tube, an electron beam propagating through the drift tube, and an array of electromagnets positioned adjacent to the drift tube, a method of controlling a magnetic field inside the drift tube comprises:

applying a first current to a first element of the array of electromagnets to cause the electron beam to bend into the target at a first location situated near the first element of the array of electromagnets;

applying a second current to a second element of the array of electromagnets;

ramping down the first current through the first element of the array of electromagnets until the current reaches zero to cause the electron beam to bend into the target at a second location situated near the second element of the array of electromagnets;

applying a third current to a third element of the array of electromagnets; and

ramping down the second current through the second element of the array of electromagnets until the current reaches zero to cause the electron beam to bend into the target at a third location situated near the third element of the array of electromagnets.

15. The method of claim 14, wherein the steps of ramping down the flow of current through the first and second elements of the array of electromagnets further comprise ramping down the flow of current in accordance with a profile that decreases linearly with time.

16. The method of claim 14, wherein the steps of ramping down the flow of current through the first and second elements of the array of electromagnets further comprise ramping down the flow of current in accordance with a step function.

17. In an x-ray beam device comprising an x-ray target, a drift tube, an electron beam propagating through the drift tube, and an array of electromagnets positioned adjacent to the drift tube, a method of controlling a magnetic field inside the drift tube comprises:

calculating a first normal distribution of current to apply to each of a plurality of elements of the array of electromagnets such that a peak of the first normal distribution is at a first location along a length of the drift tube;

applying corresponding amounts of current consistent with the first normal distribution through each of the plurality of elements of the array of electromagnets to cause the electron beam to bend into the target near the first location along the drift tube;

calculating a second normal distribution of current to apply to each of the plurality of elements of the array of electromagnets such that a peak of the second normal distribution is at a second location along the length of the drift tube; and

applying corresponding amounts of current consistent with the second normal distribution through each of the plurality of elements of the array of electromagnets to cause the electron beam to bend into the target near the second location along the drift tube.

18. The method of claim 17, wherein the step of calculating a second normal distribution of current such that a peak of the second normal distribution is at a second location along the length of the drift tube further includes calculating a shift in location that varies linearly with time.