Method for Calibrating an Analytical Instrument

• US 20080201095A1
• Filed: 02/12/2008
• Published: 08/21/2008
• Est. Priority Date: 02/12/2007
• Status: Abandoned Application

• Current Assignee: Vermillion, Inc.
• Original Assignee: Vermillion, Inc.
• Inventors: Peltier, John M., Bertenshaw, Greg P., Yip, Ping F., Mansfield, Brian C., Wiggins, Wesley S., Lecchi, Paolo
• Application Number:
  US12/030,039
• Publication Number:
  US 20080201095A1
• Time in Patent Office: Days
• US Class Current: 702/85
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: H01J 49/0009 Calibration of the apparatus

Abstract

Methods are provided for calibrating analytical instruments that comprise a quantitative device, such as spectrometers, particularly where a complex mixture is analyzed over a broad spectral range. Associated computer and analytical systems as well as software are also provided.

Claims

1. A method, comprising

providing a location in n-dimensional space of a reference centroid derived from a quantity of one or more compounds in a reference sample;

providing a location in n-dimensional space of a test centroid derived from a quantity of one or more compounds in a test sample processed by the instrument;

computing a vector associated with a distance between the reference centroid and the test centroid;

determining the extent to which an adjustment to one or more equipment settings would either decrease the distance between and/or improve the relative locations of the reference centroid and the test centroid; and

effecting an adjustment to the one or more equipment settings to calibrate the instrument.

2. The method of claim 1, wherein the instrument is a spectrometer

3. The method of claim 1, wherein the instrument is mass spectrometer.

4. The method of claim 1, wherein the instrument is selected from the group consisting of a microarray scanner, a protein chip reader and a nucleotide scanner.

5. The method of claim 1, wherein the one or more equipment settings includes a voltage setting.

6. The method of claim 1, wherein the effecting an adjustment is automated for the instrument.

7. The method of claim 1, wherein the one or more compounds in the reference sample are processed by the instrument.

8. The method of claim 1, wherein the reference sample is processed by the instrument.

9. A processor-readable medium, comprising program instructions configured to:

interpret a location in n-dimensional space of a reference centroid derived from a quantity of one or more compounds in a reference sample,

interpret a location in n-dimensional space of a test centroid derived from a quantity of one or more compounds in a test sample processed by an instrument,

compute a vector that reflects a distance between the reference centroid and the test centroid, and

output an appropriate adjustment to be effected on the instrument in order to decrease the distance between the reference centroid and the test centroid.

10. The computer readable medium of claim 9, further comprising:

program instructions configured to effect appropriate adjustment to the instrument.

11. The computer readable medium of claim 9, further comprising:

program instructions configured to display the distance between the reference centroid and the test centroid.

12. A method of tuning an analytical instrument, comprising:

locating a reference centroid in a vector space based on the results of passing a first compound and a second compound through a first analytical instrument;

locating a test centroid in the vector space based on the results of passing the first compound and the second compound through a second analytical instrument, the location of the test centroid in the vector space being a first location; and

providing an output to a user identifying a parameter of the second analytical instrument to be changed to move the test centroid to a second location in the vector space, the second location being closer to the location of the reference centroid than the first location.

13. The method of claim 12, wherein the first analytical instrument and the second analytical instrument are the same analytical instrument.

14. The method of claim 12, wherein the first analytical instrument is a mass spectrometer.

15. The method of claim 12, further comprising:

identifying the parameter based on a profile of the first compound, the profile of the first compound being produced by varying the parameter on the second analytical instrument.

16. The method of claim 12, wherein the parameter is a voltage at a location within a mass spectrometer.

17. The method of claim 12, wherein the first compound is a thermometer ion.

18. The method of claim 12, wherein the parameter to be changed moves the test centroid to an optimal location with respect to the reference centroid.

19. The method of claim 12, further comprising:

effectuating a change in the parameter of the second analytical instrument.

20. The method of claim 19, wherein the effectuating is automated.

21. The method of claim 12, wherein the method is implemented on a computer.

22. The method of claim 12, wherein the method is implemented on a computer readable medium.

23. The method of claim 12, wherein the output includes an identification of an amount of change that should be made to the parameter.

24. A method of determining a response profile of an analytical instrument having a first variable parameter and a second variable parameter, comprising:

passing a thermometer ion through the analytical instrument while the first variable parameter is set to a first value and the second variable parameter is set to a second value;

the analytical instrument providing a first output useable by a user;

varying the first variable parameter and passing the thermometer ion through the analytical instrument;

the analytical instrument providing a second output useable by a user; and

varying the second variable parameter and passing thermometer ion through the analytical instrument, the analytical instrument providing a third output useable by a user.

25. The method of claim 24, the varying the first parameter includes setting the first variable parameter to a third value and setting the second variable parameter to the second value.

26. The method of claim 24, wherein the first output useable by a user is a precursor-to-fragment ratio.

27. The method of claim 24, wherein the analytical instrument is a mass spectrometer and the first output useable by a user is a set of peaks, each peak being associated with either the thermometer ion or a fragment of the thermometer ion.

28. A method of selecting a reference response for an analytical instrument, comprising:

preparing a reference profile for a selected analyte by varying one or more instrument parameter over an appropriate range of settings to define a tuning space for that instrument; and

selecting a reference response that corresponds to instrument settings appropriate for the intended use of the instrument.

29. The method of claim 28, wherein the analytical instrument is selected from the group consisting of a mass spectrometer, an array scanner, a microarray scanner and a nuclear magnetic resonance instrument.

30. The method of claim 28, wherein the selected analyte is a thermometer ion.

31. A method of tuning an instrument, comprising:

adjusting instrument parameters so that the instrument response to the selected analyte substantially matches a selected reference response.

32. The method of claim 31, wherein the analytical instrument is a mass spectrometer.

33. The method of claim 31, wherein the selected analyte is selected from the group consisting of a mass spectrometer, an array scanner, a microarray scanner and nuclear magnetic resonance instrument.

34. The method of claim 31, wherein the tuning is automated.