High temperature ALD inlet manifold
First Claim
Patent Images
1. An atomic layer deposition device (ALD), comprising:
- a manifold body having a first passageway and a second passageway, the first passageway and the second passageway having no o-rings;
a bore located within the body and in flow communication with the first passageway and the second passageway; and
a vapor deposition chamber in flow communication with the bore and configured to house a substrate therein.
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Abstract
A system and method for distributing one or more gases to an atomic layer deposition (ALD) reactor. An integrated inlet manifold block mounted over a showerhead assembly includes high temperature (up to 200° C.) rated valves mounted directly thereto, and short, easily purged reactant lines. Integral passageways and metal seals avoid o-rings and attendant dead zones along flow paths. The manifold includes an internal inert gas channel for purging reactant lines within the block inlet manifold
474 Citations
37 Claims
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1. An atomic layer deposition device (ALD), comprising:
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a manifold body having a first passageway and a second passageway, the first passageway and the second passageway having no o-rings; a bore located within the body and in flow communication with the first passageway and the second passageway; and a vapor deposition chamber in flow communication with the bore and configured to house a substrate therein. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A multi-piece manifold assembly for a semiconductor processing device, the manifold comprising:
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a body comprising a first metallic material and having a bore; a base plate comprising the first metallic material and being coupled to the body; a cap comprising a second metallic material and being bonded to the base plate, the cap configured to mount a valve thereon; and an internal passage formed between the bore of the body and the cap, at least a portion of the internal passage extending through the body and the base plate without forming dead legs at a bond interface between the body and base plate. - View Dependent Claims (18, 19)
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20. An atomic layer deposition (ALD) device, comprising:
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a dispersion assembly configured to disperse gas; an inlet manifold block mounted over the dispersion assembly and having a bore, a first internal reactant line, and a second internal reactant line, the first and second internal reactant lines being in flow communication with the bore; a first reactant valve mounted on the inlet manifold block and configured to control a supply of a first reactant gas to the first internal reactant line; a first inert gas valve mounted on the inlet manifold block and configured to control a supply of an inert gas to the first reactant valve; a second reactant valve coupled to the inlet manifold block and configured to control a supply of a second reactant gas to the second internal reactant line; and a second inert gas valve mounted on the inlet manifold block and configured to control a supply of the inert gas to the second reactant valve. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31)
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32. A method of distributing gases to an atomic layer deposition device having a manifold and a reactor, comprising:
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routing a first reactant gas to the manifold via a first passageway having no o-rings between a first reactant valve and a manifold outlet; inhibiting the first reactant gas flow; and routing an inert gas to the manifold through a second passageway upstream of the first passageway, the second passageway having no o-rings between a first inert gas valve and the first passageway. - View Dependent Claims (33, 34, 35, 36, 37)
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Specification