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CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES

  • US 20080204055A1
  • Filed: 02/26/2008
  • Published: 08/28/2008
  • Est. Priority Date: 02/28/2007
  • Status: Active Grant
First Claim
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1. An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, comprising:

  • Circuitry that sets selected radio communication frequencies to be used for the wireless test of the integrated circuit is integrated on the semiconductor material die.

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  • 3 Assignments
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