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METHOD AND TESTING EQUIPMENT FOR LEDs AND LASER DIODES

  • US 20080205482A1
  • Filed: 02/23/2007
  • Published: 08/28/2008
  • Est. Priority Date: 02/23/2007
  • Status: Active Grant
First Claim
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1. A method of determining junction temperature for an LED, the method comprising:

  • a. Placing a sample LED in a heat chamber;

    b. Powering the sample LED with a forward pulse current;

    c. Heating the chamber and recording a temperature of the heat chamber as a function of time;

    d. Measuring change in a peak wavelength of the sample LED as a function of time;

    e. Determining the function of the change of the peak wavelength as a function of temperaturef. Using the function of the change of the peak wavelength as a function of temperature to determine junction temperature of a second LED, identical to the sample LED, by measuring a peak wavelength of the second LED for use in the function.

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