SCHEDULING WITH NEURAL NETWORKS AND STATE MACHINES

• US 20080208372A1
• Filed: 02/15/2008
• Published: 08/28/2008
• Est. Priority Date: 11/10/2003
• Status: Abandoned Application

• Current Assignee: Brooks Automation Ltd. (United Kingdom) (Azenta, Inc.)
• Original Assignee: Brooks Automation Ltd. (United Kingdom) (Azenta, Inc.)
• Inventors: Pannese, Patrick D.
• Application Number:
  US12/032,567
• Publication Number:
  US 20080208372A1
• Time in Patent Office: Days
• US Class Current: 700/48
• CPC Class Codes: G05B 13/027 using neural networks only

Abstract

Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.

Claims

1. A system comprising:

a state machine that controls operation of a semiconductor manufacturing system to schedule processing of one or more workpieces, the state machine including a plurality of states associated by a plurality of transitions, each one of the plurality of transitions having a weight assigned thereto, wherein when the state machine is operating within one of the plurality of states, a selection of a transition from the one of the plurality of states to another one of the plurality of states is determined by evaluating the weight assigned to each one of a number of possible transitions from the one of the plurality of states; and

a neural network that receives as inputs data from the semiconductor manufacturing system and provides as outputs the weights for one or more of the plurality of transitions.

2. The system of claim 1, wherein at least one of the states represents a state of an item of hardware within the semiconductor manufacturing system.

3. The system of claim 1, wherein at least one of the states represents a position of a workpiece within the semiconductor manufacturing system.

4. The system of claim 1, wherein at least one of the states represents a position of an isolation valve within the system.

5. The system of claim 1, wherein the neural network is updated in substantially real time.

6. The system of claim 1, wherein the neural network is updated every 20 milliseconds.

7. The system of claim 1, wherein the inputs to the neural network include one or more of sensor data, temperature data, a detected workpiece position, an estimated workpiece temperature, an actual workpiece temperature, a valve state, an isolation valve state, robotic drive encoder data, robotic arm position data, end effector height data, a process time, a process status, a pick time, a place time, and a control signal.

8. The system of claim 1, wherein the inputs to the neural network include at least one process time for a workpiece within the semiconductor manufacturing system.

9. The system of claim 8, wherein the at least one process time includes one or more of a target duration, a start time, an end time, and an estimated end time.

10. The system of claim 1, wherein the inputs include a transition time.

11. The system of claim 10, wherein the transition time includes one or more of a pump down to vacuum time and a vent to atmosphere time.

12. The system of claim 1, wherein at least one of the states includes a transition to itself.

13. The system of claim 1, wherein the state machine is updated in substantially real time.

14. The system of claim 1, wherein the state machine is updated every 20 milliseconds.

15. The system of claim 1, further comprising a plurality of state machines, each one of the plurality of state machines controlling a portion of the semiconductor manufacturing system according to one of a plurality of neural networks.

16. A computer program product comprising computer executable code embodied in a computer readable medium that, when executing on one or more computing devices, performs the steps of:

controlling operation of a semiconductor manufacturing system with a state machine to schedule processing of one or more workpieces, the state machine including a plurality of states associated by a plurality of transitions, each one of the plurality of transitions having a weight assigned thereto;

receiving data from the semiconductor manufacturing system;

calculating the weight assigned to each one of a number of possible transitions from a current state of the plurality of states by applying the data as inputs to a neural network; and

selecting a transition from the current state of the plurality of states by evaluating the weight assigned to each one of the number of possible transitions from the current state.

17. A method comprising:

controlling operation of a semiconductor manufacturing system with a state machine to schedule processing of one or more workpieces, the state machine including a plurality of states associated by a plurality of transitions, each one of the plurality of transitions having a weight assigned thereto;

receiving data from the semiconductor manufacturing system;

calculating the weight assigned to each one of a number of possible transitions from a current state of the plurality of states by applying the data as inputs to a neural network; and

selecting a transition from the current state of the plurality of states by evaluating the weight assigned to each one of the number of possible transitions from the current state.

18. The method of claim 17, wherein at least one of the plurality of states represents a state of an item of hardware within the semiconductor manufacturing system.

19. The method of claim 17, wherein at least one of the states represents a position of a workpiece within the semiconductor manufacturing system.

20. The method of claim 17, wherein at least one of the states represents a position of an isolation valve within the system.