PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICES
First Claim
1. A probing system for integrated circuit device, comprising:
- a test head having a first transceiving module;
a test station having a test unit coupled to the test head to perform test operation;
a communication module having a second transceiving module configured to exchange data with the first transceiving module in a wireless manner;
an integrated circuit device having a core circuit being tested; and
a test module having a self-test circuit coupled to the core circuit and the communication module for performing self-testing to the core circuit.
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Accused Products
Abstract
A probing system for integrated circuit device, which transmits testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system includes test head having a first transceiving module. There is a test station having a test unit coupled to the test head to perform test operation. A communication module has a second transceiving module configured to exchange data with the first transceiving module in a wireless manner. There is an integrated circuit device having a core circuit being tested, and a test module having a self-test circuit coupled to the core circuit and the communication module for performing the core circuit self-testing.
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Citations
21 Claims
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1. A probing system for integrated circuit device, comprising:
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a test head having a first transceiving module; a test station having a test unit coupled to the test head to perform test operation; a communication module having a second transceiving module configured to exchange data with the first transceiving module in a wireless manner; an integrated circuit device having a core circuit being tested; and a test module having a self-test circuit coupled to the core circuit and the communication module for performing self-testing to the core circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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Specification