High speed digital transient waveform detection system and method for use in an intelligent device
First Claim
1. An intelligent electronic device (IED) for detecting at least one transient waveform comprising:
- i) at least one analog-to-digital converter circuit configured to sample at least one analog voltage channel to detect and output digital samples of voltage transients in each of a plurality of sequential waveform sample periods;
ii) a waveform capture circuit configured to sample said at least one analog voltage channel and output digital samples of said at least one analog voltage channel in each of said plurality of sequential waveform sample periods; and
iii) a field programmable gate array (FPGA) configured to receive the digital samples of said voltage transients output from the at least one analog-to-digital converter circuit in each of the plurality of waveform sample periods, and detect and store a single peak transient value and its associated duration value in each of said plurality of waveform sample periods.
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Abstract
A system and a method is provided for the detection and capture, and in particular for an ultra high speed detection and capture, of transients in input voltages by an intelligent electronic device. The system and method detects transients for input voltages in either phase to phase or phase to neutral measurements and permits a user to set threshold levels for detecting transients in input voltages. In an embodiment, the system and method further provides a field programmable gate array as a controller for managing transient detection. The field programmable gate array includes a state machine for determining the state of the sampled signal with respect to a threshold level at a specified waveform sample period.
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Citations
33 Claims
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1. An intelligent electronic device (IED) for detecting at least one transient waveform comprising:
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i) at least one analog-to-digital converter circuit configured to sample at least one analog voltage channel to detect and output digital samples of voltage transients in each of a plurality of sequential waveform sample periods; ii) a waveform capture circuit configured to sample said at least one analog voltage channel and output digital samples of said at least one analog voltage channel in each of said plurality of sequential waveform sample periods; and iii) a field programmable gate array (FPGA) configured to receive the digital samples of said voltage transients output from the at least one analog-to-digital converter circuit in each of the plurality of waveform sample periods, and detect and store a single peak transient value and its associated duration value in each of said plurality of waveform sample periods. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. The IED of claim 16, wherein the parameter values comprise:
- (a) a peak transient value, (b) a continuation value for indicating that a transient value remained above the pre-determined threshold when crossing over from one waveform sample period to an adjoining waveform sample period, (c) a new transient value N for indicating that the transient was not a carryover from a previous waveform sample period and (d) a duration value indicating a duration of the peak transient value.
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17. A method for detecting transients in an input analog voltage waveform, the method comprising:
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a) receiving a plurality of transient samples from said input analog voltage waveform in successive waveform sample periods; c) determining if the currently received transient sample is greater than the previously latched input transient sample in each of said waveform sample periods; d) overwriting the previously latched input transient sample with the current transient sample in the case where said determining step is satisfied in each of said waveform sample periods; and e) identifying a peak transient sample corresponding to the currently latched input transient sample at the end of each of said waveform sample periods. - View Dependent Claims (18, 19)
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20. An intelligent electronic device (IED) comprising:
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first means for sampling at least one analog voltage channel in each of a plurality of sequential waveform sample periods at a first sampling rate and for outputting first digital samples; second means for sampling the at least one analog voltage channel in each of a plurality of sequential waveform sample periods at a second sampling rate and for outputting second digital samples, the first sampling rate being faster than the first sampling rate; means for detecting a peak transient value and its associated duration value of the first digital samples; and means for combining said peak transient value and its associated duration value with the second digital samples for a common at least one waveform sample period.
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21. An intelligent electronic device (IED) comprising:
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at least one analog to digital converter configured to sample at least one AC line voltage signal, and at least one field programmable gate array (FPGA) configured to receive samples from said at least one analog to digital converter wherein said FPGA operates as a state machine. - View Dependent Claims (22, 23, 24, 25, 26, 27)
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28. An intelligent electronic device (IED) comprising:
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at least one analog to digital converter configured to sample at least one AC line voltage signal, at least one field programmable gate array (FPGA) configured to receive samples from said at least one analog to digital converter wherein said FPGA operates as a state machine, at non-volatile mass memory for storing long term historical data, a graphical LCD display, an Ethernet connection utilizing at least one protocol, and at least one processor configured to store sample data generated from said at least one analog to digital converter in said mass memory and transfer said sample data to a central computer. - View Dependent Claims (29, 30, 31, 32, 33)
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Specification