ION GUIDE CHAMBER

• US 20080217528A1
• Filed: 03/07/2008
• Published: 09/11/2008
• Est. Priority Date: 03/08/2007
• Status: Active Grant

• Current Assignee: Tofwerk AG
• Original Assignee: Tofwerk AG
• Inventors: Gonin, Marc, Fuhrer, Katrin
• Granted Patent: US 7,935,922 B2
• Time in Patent Office: Days
• US Class Current: 250/287
• CPC Class Codes: H01J 49/04 Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

Abstract

An ion guide chamber comprising a gas-tight elongate chamber, at least one first electrode for generating a field for transporting ions along the elongate chamber and at least one second electrode for generating a field for focusing ions within the elongate chamber. The elongate chamber, e. g. constituted by a glass tube, comprises a resistive structure extending substantially along a main axis of the chamber, whereas the first electrode is constituted by the resistive structure. Furthermore, the second electrode is arranged outside the elongate chamber. Having the RF electrodes arranged outside the vacuum chamber, provides a mechanically simple solution as well as insuring that contamination of the RF electrodes to the analyte gas cannot occur. This allows for a cost-saving design of the RF electrodes and with the corresponding voltages outside the chamber, preferably at atmospheric pressure or high vacuum, avoids discharges within the tube.

Claims

1. An ion guide chamber, comprising

an elongate chamber;

at least one first electrode for generating a field for transporting ions along said elongate chamber;

at least one second electrode for generating a field for focusing ions within said elongate chamber;

wherein

said elongate chamber comprises a resistive structure extending substantially along a main axis of said elongate chamber, whereas said at least one first electrode is constituted by said resistive structure; and

in that

said at least one second electrode is arranged outside said elongate chamber.

2. The ion guide chamber as recited in claim 1, wherein said elongate chamber is constituted by a glass tube, in particular of circular cross-section.

3. The ion guide chamber as recited in claim 1, wherein said resistive structure is constituted by a resistive coating on the inside and/or outside of the elongate chamber.

4. The ion guide chamber as recited in claim 1, wherein said elongate chamber is built from a resistive material.

5. The ion guide chamber as recited in claim 1, wherein a resistance measured along a chamber main axis, between a first end of said resistive structure and a second end of said resistive structure opposite to said first end is at least 1 MΩ

, preferably at least 5 MΩ

.

6. The ion guide chamber as recited in claim 1, wherein said at least one second electrode comprises a set of elongated rods arranged substantially parallel to said elongated chamber.

7. The ion guide chamber as recited in claim 1, wherein said at least one second electrode is constituted by at least one electrically conductive or semi-conductive coated or painted surface region on an outside of said elongated chamber.

8. The ion guide chamber as recited in claim 1, wherein said field for transporting ions runs parallel to a chamber main axis and in that said field for focusing ions is a RF multipole field generating an effective potential confining ions to a region neighboring said chamber main axis.

9. The ion guide chamber as recited in claim 1, wherein a first inlet for analyte molecules and by a second inlet for a primary particle beam.

10. An apparatus for mass analysis comprising:

at least one ion guide chamber as recited in claim 1;

a first voltage generating device connected to said at least one first electrode for generating said field for transporting ions;

a second voltage generating device connected to said at least one second electrode for generating said field for focusing ions; and

a mass spectrometer, in particular a time-of-flight mass spectrometer, arranged downstream of said at least one ion guide chamber.

11. The apparatus for mass analysis as recited in claim 10, further comprising a high pressure ion source arranged upstream of said at least one ion guide chamber.

12. The apparatus for mass analysis as recited in claim 11, wherein an ion gate is arranged upstream of the at least one ion guide chamber and in that the ion guide chamber is operated at elevated pressure such that ions injected into said ion guide chamber are separated according to their collision cross section and charge state.

13. The apparatus for mass analysis as recited in claim 10, wherein said ion guide chamber is operated as an ion source.

14. The apparatus for mass analysis as recited in claim 11, wherein said second voltage generating device is capable of generating a rotating multipole field at said at least one second electrode.

15. The apparatus for mass analysis as recited in claim 11, wherein said second voltage generating device is capable of generating an additional excitation RF field to be super-positioned to a confining RF field.

16. The apparatus for mass analysis as recited in claim 15, wherein said second voltage generating device is designed in such a way that a superimposed RF frequency is generated such that ions belonging to one or several narrow bands of m/Q are exited onto an orbit around a center axis.

17. The ion guide chamber as recited in claim 1, wherein said elongate chamber is gas-tight.