Lithographic apparatus and device manufacturing method
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Abstract
An immersion lithography apparatus is disclosed having a liquid supply system configured to at least partially fill a space between a final element of a projection system and a substrate table, with a first liquid, and a measurement system configured to measure a location of each of a plurality of points on the substrate, the measurement system being arranged such that measurements take place through a second liquid, the second liquid not being supplied by the liquid supply system.
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Citations
43 Claims
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1-23. -23. (canceled)
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24. A lithographic apparatus, comprising:
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a substrate table configured to hold a substrate; a projection system configured to project a patterned beam of radiation onto a target portion of the substrate; a first liquid supply system configured to at least partially fill a space between a final element of the projection system and the substrate table, with a first liquid; a measurement system configured to measure a location of each of a plurality of points on the substrate, the measurement system being arranged such that measurements take place through a second liquid provided by a second liquid supply system, the second liquid supply system separate from the first liquid supply system and configured to at least partially fill a space between a final element of the measurement system and the substrate table with the second liquid; wherein at least one of the supply systems is movable along a direction substantially parallel to an optical axis of the corresponding projection system or measurement system. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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35. A device manufacturing method comprising:
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projecting a patterned beam of radiation onto a target portion of a substrate through a first liquid supplied between the substrate and the projection system with a first liquid supply system, the first liquid supply system configured to at least partially fill a space between the substrate and a final element of a projection system; measuring a location of each of a plurality of points on the substrate through a second liquid provided by a second liquid supply system, the second liquid supply system separate from the first liquid supply system and configured to at least partially fill a space between a final element of a measurement system and the substrate with the second liquid; and moving at least one of the supply systems along a direction substantially parallel to an optical axis of the corresponding projection system or measurement system. - View Dependent Claims (36, 37, 38, 39, 40, 41, 42, 43)
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Specification