Attenuated total reflection probe and spectrometer therewith

• US 20080218734A1
• Filed: 03/06/2008
• Published: 09/11/2008
• Est. Priority Date: 03/08/2007
• Status: Active Grant

• Current Assignee: Kurashiki Boseki Kabushiki Kaisha
• Original Assignee: Kurashiki Boseki Kabushiki Kaisha
• Inventors: Higashi, Noboru, Ikehata, Akifumi, Ozaki, Yukihiro
• Granted Patent: US 7,791,729 B2
• Time in Patent Office: Days
• US Class Current: 356/51
• CPC Class Codes: G01N 21/33 using ultraviolet light G01N21/39 takes precedence
• CPC Class Codes: G01N 21/552 Attenuated total reflection

Abstract

An attenuated total reflection probe has a prism and a supporter. The prism is made of an optical material which transmits light in far ultraviolet region, and has a contact plane to be in contact with a sample, and an incoming plane and an outgoing plane both not to be in contact with the sample. The supporter has an opening and is connected hermetically with the prism around the opening and eventually exposes the contact plane facing the opening. The contact plane, the incoming plane and the outgoing plane of the prism are formed such that light transmitting the incoming plane enters the contact plane at an incident angle larger than critical angle and that the light totally reflected by the contact plane goes out through the outgoing plane.

Claims

1. An attenuated total reflection probe comprising:

a prism, made of an optical material which transmits light in far ultraviolet region, comprising a contact plane to be in contact with a sample, and an incoming plane and an outgoing plane both not to be in contact with the sample; and

a supporter having an opening, connected hermetically with the prism around the opening, the supporter eventually exposing the contact plane facing the opening;

wherein the contact plane, the incoming plane and the outgoing plane of the prism are formed such that light transmitting the incoming plane enters the contact plane at an incident angle larger than critical angle and that the light totally reflected by the contact plane goes out through the outgoing plane.

2. The attenuated total reflection probe according to claim 1, wherein an optical path length from the incoming plane through the contact plane to the outgoing plane has internal transmittance equal to or larger than 10% for light of 160 nm of wavelength incident on the incoming plane.

3. The attenuated total reflection probe according to claim 1 or 2, wherein the optical material of the prism is one of synthetic quartz, quartz and sapphire.

4. The attenuated total reflection probe according to claim 1 or 2, wherein the optical material of the prism is synthetic quartz, and the supporter is made of synthetic quartz.

5. The attenuated total reflection probe according to claim 1 or 2, wherein the optical material of the prism is sapphire, and the supporter is made of sapphire.

6. A spectroscope comprising:

an attenuated total reflection probe, which comprises;

a prism, made of an optical material which transmits light in far ultraviolet region, comprising a contact plane to be in contact with a sample, and an incoming plane and an outgoing plane both not to be in contact with the sample; and

a supporter having an opening, connected hermetically with the prism around the opening, the supporter eventually exposing the contact plane facing the opening;

wherein the contact plane, the incoming plane and the outgoing plane of the prism are formed such that light transmitting the incoming plane enters the contact plane at an incident angle larger than critical angle and that the light totally reflected by the contact plane goes out through the outgoing plane;

a light source which radiates ultraviolet light towards the attenuated total reflection probe;

a photodetector which detects light of total reflection received from the attenuated total reflection probe; and

an optical element for dispersing ultraviolet light in an optical path from the light source to the photodetector.