Waveguide sensors optimized for discrimination against non-specific binding
First Claim
1. A method for detecting a target material located within a first range of distances, above the surface of a waveguide of predetermined dimensions, and in the presence of a non target material in a second range of distances close to the waveguide surface, said first and second ranges being sufficiently close for material to effect therewithin propagation of radiation in said waveguide, said method comprising the steps of:
- directing a first radiation of a selected wavelength and phase through said waveguide;
directing a second radiation of a selected wavelength and phase through said waveguide;
interferometrically detecting a phase difference between the first radiation and the second radiation as the first radiation and the second radiation are directed through said waveguide;
the detected phase difference having a relatively low first component effect provided by the selected wavelength of the first radiation and the selected wavelength of the second radiation cooperating with said predetermined dimensions of the waveguide to act on the phase difference caused by the non target material;
the detected phase difference having a relatively large second component effect provided by the selected wavelength of the first radiation and the selected wavelength of the second radiation cooperating with said predetermined dimensions of the waveguide to act on the phase difference caused by the target material; and
detecting the target material by comparing the first component effect and the second component effect.
1 Assignment
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Accused Products
Abstract
A system for interferometrically detecting the present of bound material using a wave propagating waveguide and the influence on propagation time of bound material in the proximity of the waveguide. The waveguide layer thickness and the radiation wavelength λ are selected so that the effects on phase difference between the two radiations applied in the beam are minimal in the region directly adjacent the surface of the waveguide, so as to unmask the influence of the more distant bound materials.
7 Citations
44 Claims
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1. A method for detecting a target material located within a first range of distances, above the surface of a waveguide of predetermined dimensions, and in the presence of a non target material in a second range of distances close to the waveguide surface, said first and second ranges being sufficiently close for material to effect therewithin propagation of radiation in said waveguide, said method comprising the steps of:
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directing a first radiation of a selected wavelength and phase through said waveguide; directing a second radiation of a selected wavelength and phase through said waveguide; interferometrically detecting a phase difference between the first radiation and the second radiation as the first radiation and the second radiation are directed through said waveguide; the detected phase difference having a relatively low first component effect provided by the selected wavelength of the first radiation and the selected wavelength of the second radiation cooperating with said predetermined dimensions of the waveguide to act on the phase difference caused by the non target material; the detected phase difference having a relatively large second component effect provided by the selected wavelength of the first radiation and the selected wavelength of the second radiation cooperating with said predetermined dimensions of the waveguide to act on the phase difference caused by the target material; and detecting the target material by comparing the first component effect and the second component effect. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41)
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42. A method for detecting a presence of a target material at a distance from a surface of a waveguide in a presence of a non target material closer to said surface comprising the steps of:
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selecting a wavelength of a radiation; selecting a thickness of said waveguide; having the non target material bound to said surface more closely than a target material bound to said surface; applying the radiation in a TE0 mode to said waveguide; applying the radiation in a TEM mode to said waveguide; combining the radiation in the TE0 mode and the radiation in a TEM mode to create an interference pattern; the waveguide thickness being selected to enhance an effect of target material on said interference pattern relative to an effect of non target material; and detecting the presence of the target material based on the interference pattern. - View Dependent Claims (44)
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43. (canceled)
Specification