×

SYSTEM AND METHOD FOR MEASURING SIMILARITY OF SEQUENCES WITH MULTIPLE ATTRIBUTES

  • US 20080235222A1
  • Filed: 03/21/2007
  • Published: 09/25/2008
  • Est. Priority Date: 03/21/2007
  • Status: Abandoned Application
First Claim
Patent Images

1. A computer configured to execute a process of quantifying an ordered sequence of data, said computer comprising:

  • a data receiver to receive data of said ordered sequence; and

    a calculator to determine a skeleton of said ordered sequence,wherein said skeleton comprises a plurality of perceptually important points (PIPs) of said ordered sequence, as derived by determining one or more points of local maxima of said data over said ordered sequence.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×