SYSTEM FOR AUTOMATICALLY LOCATING AND MANIPULATING POSITIONS ON AN OBJECT

• US 20080239478A1
• Filed: 03/20/2008
• Published: 10/02/2008
• Est. Priority Date: 03/29/2007
• Status: Abandoned Application

• Current Assignee: Triantafyllos P. Tafas, Youngmin Kim
• Original Assignee: Triantafyllos P. Tafas, Youngmin Kim
• Inventors: Kim, Youngmin, Tafas, Triantafyllos P.
• Application Number:
  US12/052,421
• Publication Number:
  US 20080239478A1
• Time in Patent Office: Days
• US Class Current: 359/396
• CPC Class Codes: G01N 2001/282 with mapping; Identification of areas; Spatial correlated pattern
• CPC Class Codes: G01N 2035/00782 reprogrammmable code
• CPC Class Codes: G01N 2035/00851 process control parameters
• CPC Class Codes: G01N 35/00732 Identification of carriers, materials or components in automatic analysers
• CPC Class Codes: G02B 21/34 Microscope slides, e.g. mounting specimens on microscope slides

Abstract

Methods and systems for determining the relative location and attitude between two objects by means of positional tags and positional tag interrogation sensors are disclosed. Specific embodiments are addressed to positioning of microscope slides, assembly of mechanical components, and locating construction tools relative to a work piece.

Claims

1. A multiple object positioning and guiding system, for positioning a first object at a desired position and orientation relative to a second object, comprising:

a plurality of positional tags affixed to body of said second object at points which define three orthogonal axes of said second object;

an array of positional tag interrogation sensor elements located, external to said first object and said second object, at known reference locations relative to said first object;

each of said positional tag interrogation sensor elements physically configured at said locations which define three orthogonal axes of said array;

a computer operatively configured to compute the distance from each of the said positional tag interrogation sensor elements to each of the said positional tags and, subsequently, to compute the location of each of the said positional tags; and

to compute the position and attitude of the said second object relative to said first object;

an interface operationally configured to communicate the said position and attitude results of the said computer.

2. The multiple object positioning and guiding system of claim 1, where a plurality of positional tags are affixed to said first object at locations which define three orthogonal axes of said first object.

3. The multiple object positioning and guiding system of claim 1, where said first object is a work piece and said second object is a tool.

4. The multiple object positioning and guiding system of claim 1 where said first object is a mechanical assembly and said second object is a component to be physically connected to said mechanical assembly.

5. The multiple object positioning and guiding system of claim 1, where the said positional tags are passive or active radio frequency reflector tags and said positional tag interrogation sensor elements interrogate said radio frequency tags.

6. The multiple object positioning and guiding system of claim 5, where the said positional tags are radio frequency identification tags (RFID) and said positional tag interrogation sensor elements interrogate said RFID tags.

7. The multiple object positioning and guiding system of claim 1, where the said positional tags are passive or active optical reflector tags said positional tag interrogation sensor elements interrogate said optical tags.

8. The multiple object positioning and guiding system of claim 1, where the said positional tags are passive or active acoustic reflector tags said positional tag interrogation sensor elements interrogate said acoustic tags.

9. An automated orientation-determining microscope slide comprising:

a microscope slide having an upper surface, a lower surface;

at least one positional tag fastened to said upper surface of said microscope slide;

a shielding material affixed to said lower surface of said microscope slide, in proximity to said positional tag, whereby said positional tag is obscured when viewed through said lower surface.

10. The automated orientation-determining microscope slide as in claim 9 where:

said positional tag is a radio frequency identification tag (RFID); and

said shielding material is a radio frequency attenuator.

11. A method for automatically determining the orientation of a microscope slide comprising the steps of.

obtaining a microscope slide having an upper surface, a lower surface, at least one positional tag fastened to said upper surface of said microscope slide, a shielding material affixed to said lower surface of said microscope slide, in proximity to said positional tag, whereby said positional tag is obscured when viewed through said lower surface;

preparing and placing specimen on said microscope slide;

placing said microscope slide in examining position;

interrogating said positional tag with appropriate sensor located so as not to be obscured by said shielding material when said microscope slide has an upward orientation;

determining said microscope slide has upward orientation if interrogation is successful.

12. A microscope slide comprising:

a substrate;

at least one radio frequency identification tag permanently affixed to said substrate, said radio frequency identification tag including non-volatile write-once/read-many memory operatively configured to transmit a radio frequency carrier modulated with data stored in said memory, in response to interrogation signal.