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Photon transfer curve test time reduction

  • US 20080243419A1
  • Filed: 04/05/2007
  • Published: 10/02/2008
  • Est. Priority Date: 03/28/2007
  • Status: Active Grant
First Claim
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1. A method for photon transfer curve (PTC) testing to determine pixel reliability in an image sensor device, comprising:

  • (a) providing a substrate and a sensor array having a plurality of pixels rows and columns formed thereon wherein each pixel is comprised of a charged photo gate at the base of a light column and a capacitor (storage node) for storing charge transferred from the photo gate, said substrate is linked to a test system;

    (b) illuminating the sensor array with a uniform light source such that a first plurality of x1 pixels in a first region are illuminated at a first light intensity level m1 in a first step, a second plurality of x2 pixels in a second region are illuminated at a second light intensity level m2 in a second step, and so forth up to an nth plurality of xn pixels in an nth region illuminated at a light intensity level mn in an nth step wherein x1, x2, . . . xn are integers, mn>

    m2>

    m1, and the length of each step is a constant time “

    t”

    ;

    (c) transferring a residual charge in the photo gate to a capacitor for each pixel and subsequently sending residual charge information for each pixel to an image processor where an image for a first frame (F1) is generated, said image has a top and bottom and two sides;

    (d) resetting the photo gate to the same charged state as in step (a); and

    (e) repeating steps (b)-(c) in succession to form an image having a top and bottom and two sides for a second frame (F2) in said image processor wherein illumination values for F1, F2, and (F2

    F1) may be calculated and a difference frame (F2

    F1) determined.

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