Photon transfer curve test time reduction
First Claim
1. A method for photon transfer curve (PTC) testing to determine pixel reliability in an image sensor device, comprising:
- (a) providing a substrate and a sensor array having a plurality of pixels rows and columns formed thereon wherein each pixel is comprised of a charged photo gate at the base of a light column and a capacitor (storage node) for storing charge transferred from the photo gate, said substrate is linked to a test system;
(b) illuminating the sensor array with a uniform light source such that a first plurality of x1 pixels in a first region are illuminated at a first light intensity level m1 in a first step, a second plurality of x2 pixels in a second region are illuminated at a second light intensity level m2 in a second step, and so forth up to an nth plurality of xn pixels in an nth region illuminated at a light intensity level mn in an nth step wherein x1, x2, . . . xn are integers, mn>
m2>
m1, and the length of each step is a constant time “
t”
;
(c) transferring a residual charge in the photo gate to a capacitor for each pixel and subsequently sending residual charge information for each pixel to an image processor where an image for a first frame (F1) is generated, said image has a top and bottom and two sides;
(d) resetting the photo gate to the same charged state as in step (a); and
(e) repeating steps (b)-(c) in succession to form an image having a top and bottom and two sides for a second frame (F2) in said image processor wherein illumination values for F1, F2, and (F2−
F1) may be calculated and a difference frame (F2−
F1) determined.
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Abstract
An improved method for photon transfer curve (PTC) testing in an image sensor is described. A cost and time savings is achieved by reducing the number of frames necessary for measurements to two that are generated by illuminating a first plurality of pixel rows at a first intensity level m1, a second plurality of pixel rows at a second intensity level t2, and so forth up to an nth plurality of pixel rows illuminated at an nth intensity level mn where mn>m2>m1. The resulting image has “n” regions each with a different brightness. The highest intensity level essentially saturates the pixels in the nth region. In one example, a four row exposure and five intensity levels are employed in the illuminator sequence. An intelligent light source is pre-programmable with illumination intensity settings and is synchronized to the image sensor using HSYNC and VSYNC signals, for example.
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Citations
20 Claims
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1. A method for photon transfer curve (PTC) testing to determine pixel reliability in an image sensor device, comprising:
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(a) providing a substrate and a sensor array having a plurality of pixels rows and columns formed thereon wherein each pixel is comprised of a charged photo gate at the base of a light column and a capacitor (storage node) for storing charge transferred from the photo gate, said substrate is linked to a test system; (b) illuminating the sensor array with a uniform light source such that a first plurality of x1 pixels in a first region are illuminated at a first light intensity level m1 in a first step, a second plurality of x2 pixels in a second region are illuminated at a second light intensity level m2 in a second step, and so forth up to an nth plurality of xn pixels in an nth region illuminated at a light intensity level mn in an nth step wherein x1, x2, . . . xn are integers, mn>
m2>
m1, and the length of each step is a constant time “
t”
;(c) transferring a residual charge in the photo gate to a capacitor for each pixel and subsequently sending residual charge information for each pixel to an image processor where an image for a first frame (F1) is generated, said image has a top and bottom and two sides; (d) resetting the photo gate to the same charged state as in step (a); and (e) repeating steps (b)-(c) in succession to form an image having a top and bottom and two sides for a second frame (F2) in said image processor wherein illumination values for F1, F2, and (F2−
F1) may be calculated and a difference frame (F2−
F1) determined. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method for photon transfer curve testing to determine pixel reliability in an image sensor device, comprising:
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(a) providing a substrate and a sensor array having a plurality of pixels rows and columns formed thereon wherein each pixel is comprised of a charged photo gate at the base of a light column and a capacitor (storage node) for storing charge transferred from the photo gate, said substrate is linked to a test system; (b) illuminating the sensor array with a uniform light source such that a first plurality of x1 pixel rows are illuminated at a first intensity level m1 in a first step, a second plurality of x2 pixel rows are illuminated at a second intensity level m2 in a second step, and so forth up to an nth plurality of xn pixel rows illuminated at an intensity level mn in an nth step wherein x1-xn are integers, mn>
m2>
m1, and all rows are illuminated for a constant time “
t”
;(c) transferring a residual charge in the photo gate to a capacitor for each pixel and subsequently sending residual charge information for each pixel to an image processor where an image for a first frame (F1) is generated, said image has a top and bottom; (d) resetting the photo gate to the same charged state as in step (a); (e) repeating steps (b)-(c) in succession to form an image having a top and bottom for a second frame (F2) in said image processor wherein illumination values for F1, F2, and (F2−
F1) may be calculated and a difference frame (F2−
F1) determined. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20)
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Specification