Method for cleaning semiconductor wafer surfaces by applying periodic shear stress to the cleaning solution
First Claim
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1. A method for cleaning, comprising:
- providing a wafer having a surface, the surface having a particle thereon;
providing a cleaning media on the surface, the cleaning media including one or more dispersed coupling elements suspended therein; and
applying external energy to the cleaning media, the application of the external energy to the cleaning media generating a periodic shear stress within the cleaning media,wherein the periodic shear stress imparts a force on at least one of the one or more of the coupling elements, the force causing an interaction between the at least one of the one or more coupling elements and the particle to remove the particle from the surface.
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Abstract
Systems and methods for cleaning particulate contaminants adhered to wafer surfaces are provided. A cleaning media including dispersed coupling elements suspended within the cleaning media is applied over a wafer surface. External energy is applied to the cleaning media to generate periodic shear stresses within the media. The periodic shear stresses impart momentum and/or drag forces on the coupling elements causing the coupling elements to interact with the particulate contaminants to remove the particulate contaminants from the wafer surfaces.
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Citations
31 Claims
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1. A method for cleaning, comprising:
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providing a wafer having a surface, the surface having a particle thereon; providing a cleaning media on the surface, the cleaning media including one or more dispersed coupling elements suspended therein; and applying external energy to the cleaning media, the application of the external energy to the cleaning media generating a periodic shear stress within the cleaning media, wherein the periodic shear stress imparts a force on at least one of the one or more of the coupling elements, the force causing an interaction between the at least one of the one or more coupling elements and the particle to remove the particle from the surface. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A system for cleaning, comprising:
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a carrier for supporting a wafer having a surface, the surface having a particle thereon; a tank having a cavity defined by a base and one or more sidewalls extending therefrom, the tank being configured to hold a volume of a cleaning media within the cavity to immerse the wafer, wherein the cleaning media includes one or more dispersed coupling elements suspended therein; and one or more transducers coupled to at least one of the one or more sidewalls or the base, the one or more transducers applying acoustic energy to the cleaning media, wherein the acoustic energy generates a periodic shear stress within the cleaning media, and wherein the periodic shear stress imparts a force on at least one of the one or more dispersed coupling elements causing the at least one of the one or more dispersed coupling element to interact with the particle to facilitate the removal of the particle from the surface. - View Dependent Claims (19, 20, 21)
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22. A system for cleaning, comprising:
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a processing chamber having a carrier element, the carrier element being capable of supporting a wafer within the processing chamber such that a surface of the wafer is exposed, the exposed wafer surface having a particle thereon; and a jet assembly, wherein the jet assembly is configured to generate acoustic energy, apply the acoustic energy to a cleaning media as the cleaning media travels along a throughway of the jet assembly, wherein the cleaning media includes one or more dispersed coupling elements suspended therein and the acoustic energy alters a physical characteristic of each of the dispersed coupling elements before application of the cleaning media to the exposed wafer surface, and wherein fluid motion from a jet of the jet assembly imparts a force on at least one of the altered one or more dispersed coupling elements causing the at least one of the altered one or more dispersed coupling element to interact with the particle to remove the particle from the exposed wafer surface. - View Dependent Claims (23, 24, 25)
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26. A system for cleaning, comprising:
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a processing chamber having a carrier element, the carrier element being capable of supporting a wafer within the processing chamber such that a surface of the wafer having a particle disposed thereon is exposed; a fluid supply assembly, the fluid supply assembly being configured to supply a cleaning media to the surface, the cleaning media including one or more dispersed coupling elements suspended therein; and a energy source capable of generating acoustic energy, wherein the acoustic energy is applied to cleaning media at surface, thereby generating a periodic shear stress within the cleaning media, the periodic shear stress imparting a force on at least one of the one or more dispersed coupling elements causing the at least one of the one or more dispersed coupling element to interact with the particle to remove the particle from the surface.
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27. A system for cleaning, comprising:
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a transducer capable of generating acoustic energy disposed proximal to a back surface of a wafer, the wafer including a front surface opposite the back surface, the front surface having a particle thereon; a first fluid supply assembly, the first fluid supply assembly being capable of supplying a liquid layer between the back surface of the wafer and the transducer; a second fluid supply assembly, the second fluid supply assembly being capable of supplying a cleaning media including one or more dispersed coupling elements suspended therein on the front surface of the wafer, wherein the acoustic energy is transferred from the transducer through the liquid layer and the wafer into the cleaning media at the front surface of the wafer, thereby generating a periodic shear stress within the cleaning media, the periodic shear stress imparting a force on at least one of the one or more dispersed coupling elements causing the at least one of the one or more dispersed coupling element to interact with the particle to remove the particle from the front surface. - View Dependent Claims (28, 29, 30, 31)
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Specification