METHODS AND APPARATUS FOR DATA ANALYSIS
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
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Citations
50 Claims
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1. (canceled)
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2. (canceled)
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3. (canceled)
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4. (canceled)
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5. A test data analysis system for analyzing test data for a set of components, comprising:
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a memory for storing the test data; and an outlier identification system having access to the memory and configured to identify outliers in the test data according to a selected outlier identification algorithm, wherein the outlier identification system is configured to automatically select the selected outlier identification algorithm from a plurality of outlier identification algorithms. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A computer-implemented method for testing components, comprising:
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obtaining test data for the components; automatically selecting an outlier identification algorithm from a plurality of outlier identification algorithms; and automatically identifying outliers in the test data according to the selected outlier identification algorithm. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 50)
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35. A medium storing instructions executable by a machine, wherein the instructions cause the machine to execute a method for analyzing test data comprising:
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obtaining test data for the components; automatically selecting an outlier identification algorithm from a plurality of outlier identification algorithms; and automatically identifying an outlier in the test data using the selected outlier identification algorithm. - View Dependent Claims (36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49)
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Specification