Systems And Methods For Monitoring Plating And Etching Baths
First Claim
1. A system for monitoring the composition of electrolyte bath fluids, the system comprising:
- (a) a sampling probe comprising;
(i) a substrate having a measurement microchannel adapted for connection to a fluid pump mechanism; and
(ii) a set of electrodes disposed on an inner surface of the measurement microchannel; and
(b) monitoring electronics connected to the set of electrodes, wherein the monitoring electronics and set of electrodes are configured to measure one or more electrochemical properties of a predetermined volume of the bath fluids pumped through the measurement microchannel.
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Accused Products
Abstract
Methods and systems for monitoring electrolyte bath fluids are provided. The electrolyte bath fluids can be electroplating, electroless plating or etching solutions. The monitoring systems employ microfluidic devices, which have built in microfluidic channels and microfabricated thin-film electrodes. The devices are configured with fluid pumps to control the movement and mixing of test fluids through the microfluidic channels. The microfabricated thin-film electrodes are configured so that the plating or etching bath fluid composition can be characterized by electrochemical measurements. The monitoring methods and system provide faster measurement times, generate minimal waste, and occupy dramatically reduced physical space compared to conventional bath-monitor systems. The monitoring systems and method also provide low-cost system and methods for measuring or monitoring electroless plating bath rates.
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Citations
29 Claims
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1. A system for monitoring the composition of electrolyte bath fluids, the system comprising:
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(a) a sampling probe comprising; (i) a substrate having a measurement microchannel adapted for connection to a fluid pump mechanism; and (ii) a set of electrodes disposed on an inner surface of the measurement microchannel; and (b) monitoring electronics connected to the set of electrodes, wherein the monitoring electronics and set of electrodes are configured to measure one or more electrochemical properties of a predetermined volume of the bath fluids pumped through the measurement microchannel. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 19)
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14. A system for measuring plating rates in plating baths, the system comprising:
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a sampling probe comprising; a substrate having an array of microchannels including at least one measurement microchannel, each microchannel adapted for connection to a fluid pump mechanism; and
a set of electrodes disposed on an inner surface of the measurement microchannel, wherein the fluid pump mechanisms are configured to insert plating bath fluids and stripping solutions over an electrode, whereby plating and stripping can occur on a surface of the electrode; and
monitoring electronics connected to the electrodes, wherein the monitoring electronics and set of electrodes are configured to measure currents as a function of voltages applied to the electrodes, wherefrom a plating rate is calculated.
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15. A system for determining additive concentrations in an etching bath solution, the system comprising:
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a) a substrate having at least one microchannel and a set of thin film electrodes disposed on an interior surface of the microchannel; b) at least one pump connected to the microchannel for flowing fluids through the microchannel; c) at least one of a potentiostat and a power supply that are electrically connected to the electrodes; and f) means for measuring an electric current when a voltage is applied to said electrodes, wherein the electric current is a function of the composition of fluids through the microchannel; - View Dependent Claims (16, 17, 18)
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20. A sampling probe for use in electrolyte bath monitoring systems, the sampling probe comprising reversible mechanical connectors for physically connecting a microchannel to a corresponding fluid pumping mechanism and for electrically connecting the set of electrodes to the electronics, whereby the sampling probe can be used as a disposable part.
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21. A method of monitoring the composition of plating or etching bath fluids, the method comprising:
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(a) providing a sampling probe that comprises; a substrate having a measurement microchannel adapted for connection to a fluid pump mechanism; and a set of electrodes disposed on an inner surface of the measurement microchannel; (b) flowing a test sample of the bath fluids through the measurement channel; and (c) applying and measuring electrical voltages and/or currents at the electrodes to determine one or more electrochemical properties of the test sample of the bath fluids flowing through the measurement microchannel, wherein the determined electrochemical properties correspond to a composition of the bath fluids. - View Dependent Claims (22, 23, 24)
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25. A method of measuring the plating rate obtained in a given plating bath, the method comprising:
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(a) providing a sampling probe, the sampling probe comprising; a substrate having a measurement microchannel adapted for connection to a fluid pump mechanism; and an electrode disposed on an inner surface of the measurement microchannel; (b) flowing a sample of the plating bath fluids through the measurement channel so that plating occurs on the electrode surface for a predetermined period of time; (c) next, flowing a stripping solution through the measurement channel so that the plating that has occurred on the electrode surface is stripped from the electrode surface; (d) measuring the stripping charge on the electrode during stripping of the plating that has occurred on the electrode surface; and (e) using the measured stripping charge as an indication of the plating rate obtained in the given plating bath. - View Dependent Claims (26)
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27. A method of monitoring an etching bath, the method comprising:
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controlling a flow rate of a test solution of the etching bath through a microchannel having working, and reference electrodes disposed therein; applying a voltage between the working and reference electrodes; measuring and recording the current flowing between the working and reference electrodes. - View Dependent Claims (28, 29)
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Specification