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Leadframe Configuration to Enable Strip Testing of SOT-23 Packages and the Like

  • US 20080265923A1
  • Filed: 02/06/2008
  • Published: 10/30/2008
  • Est. Priority Date: 04/27/2007
  • Status: Abandoned Application
First Claim
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1. A strip of leadframes configured for strip testing of integrated circuit devices, comprising:

  • a plurality of leadframes within a strip, each of the plurality of leadframes comprising an integrated circuit device;

    each of the integrated circuit devices comprisinga die paddle,an integrated circuit die attached to a face of the die paddle,a common lead connected to an edge of the die paddle and to a respective one of the plurality of leadframes,a reduced width tie bar connected to another edge of the die paddle and to the respective one of the plurality of leadframes,at least two signal leads electrically coupled to the integrated circuit die, andthe common lead electrically coupled to the integrated circuit die;

    wherein the at least two signal leads are electrically isolated from the respective ones of the plurality of leadframes so that each of the plurality of integrated circuit devices can be electrically tested before being removed from the plurality of leadframes within the strip.

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