×

DUAL MEASUREMENT ANALYTE DETECTION SYSTEM

  • US 20080268486A1
  • Filed: 07/10/2008
  • Published: 10/30/2008
  • Est. Priority Date: 04/15/2003
  • Status: Abandoned Application
First Claim
Patent Images

1. An analyte detection system for detecting more than one analyte, the system comprising:

  • an analyte detector in fluid communication with a source of a material sample and configured to measure a first characteristic of the material sample;

    a processing circuit in electronic communication with the analyte detector, the processing circuit configured to use the first measured characteristic to determine the concentration of a first analyte in the material sample and compare the concentration of said first analyte to a range given by an upper and a lower value of concentration, the processing circuit further configured to activate said analyte detection device to measure a second characteristic of said material sample, if the concentration of the first analyte is outside the range, and use the second measured characteristic to determine the concentration of a second analyte.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×