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METHOD FOR PERFORMING FAILURE MODE AND EFFECTS ANALYSIS OF AN INTEGRATED CIRCUIT AND COMPUTER PROGRAM PRODUCT THEREFOR

  • US 20080276206A1
  • Filed: 04/11/2008
  • Published: 11/06/2008
  • Est. Priority Date: 04/13/2007
  • Status: Active Grant
First Claim
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1. A method for performing failure mode and effects analysis (FMEA) on integrated circuits comprising:

  • preparing a FMEA database of a integrated circuit under design and computing FMEA results from said FMEA database,automatically extracting information from a integrated circuit description, said extraction of information comprising;

    reading integrated circuit information,partitioning said circuit in invariant and elementary sensitive zones (SZ), andusing said information in the preparing the FMEA database.

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