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DEVICE FOR ANALYSIS OF A SAMPLE ON A TEST ELEMENT

  • US 20080277280A1
  • Filed: 04/18/2008
  • Published: 11/13/2008
  • Est. Priority Date: 10/25/2005
  • Status: Active Grant
First Claim
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1. An analysis device for analysis of a sample on a test element, comprising at least one first component configured to make electrical contact with at least one second component for electrical transmission therebetween, wherein the first component comprises an injection-molded circuit mount.

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