IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION

• US 20080278716A1
• Filed: 07/25/2008
• Published: 11/13/2008
• Est. Priority Date: 11/24/2004
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Hannebaum, Reed, Engelbart, Roger W., Pollock, Tim
• Granted Patent: US 7,576,850 B2
• Time in Patent Office: Days
• US Class Current: 356/237.2
• CPC Class Codes: B29C 70/38 Automated lay-up, e.g. using robots, laying filaments according to predetermined patterns application heads for tyres B29D30/28
• CPC Class Codes: B29C 70/386 Automated tape laying [ATL]
• CPC Class Codes: G01N 2021/8472 Investigation of composite materials

Abstract

A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).

Claims

1. A method of detecting a flaw or a FOD in a structure during fabrication of that structure comprising:

generating light rays;

directing said light rays at a portion of the structure and at acute angles relative to said portion;

monitoring said portion; and

detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion.

2. A method as in claim 1 wherein generating said light rays comprises generating said lights rays at a single illumination level.

3. A method as in claim 1 wherein detecting said FOD comprises detecting light reflection characteristics of said FOD illuminated at a single illumination level.

4. A method as in claim 1 wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously.

5. A method as in claim 1 wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously in response to illumination of said portion at a single illumination level.

6. A method as in claim 1, wherein said acute angles are approximately greater than or equal to 2°

and approximately less than or equal to 15°

relative to said portion.

7. A method as in claim 1, wherein said detecting said FOD comprises detecting contrast differences between said FOD and said portion.

8. A method as in claim 1 further comprising the step of generating status signals indicative of said FOD in said portion.

9. A method as in claim 8 further comprising the step of storing said status signals for future analysis and/or processing.

10. A method as in claim 1 further comprising the step of indicating said FOD in said portion to a user via a display.

11. A method as in claim 4 further comprising the step of indicating said at least one flaw and said FOD in said portion to a user via a display.

12. A method of detecting a flaw or a FOD in a structure during fabrication of that structure comprising:

generating light rays;

directing said light rays at a portion of the structure and at acute angles relative to said portion;

monitoring said portion;

detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion;

generating status signals indicative of said FOD in said portion;

storing said status signals for future analysis and/or processing; and

indicating said FOD in said portion to a user via a display.

13. A method as in claim 12 wherein generating said light rays comprises generating said lights rays at a single illumination level.

14. A method as in claim 12 wherein detecting said FOD comprises detecting light reflection characteristics of said FOD illuminated at a single illumination level.

15. A method as in claim 12 wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously.

16. A method as in claim 12 wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously in response to illumination of said portion at a single illumination level.

17. A method as in claim 12, wherein said acute angles are approximately greater than or equal to 2°

and approximately less than or equal to 15°

relative to said portion.

18. A method as in claim 12, wherein said detecting said FOD comprises detecting contrast differences between said FOD and said portion.