System and method for estimating reliability of components for testing and quality optimization
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Abstract
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
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Citations
52 Claims
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1-46. -46. (canceled)
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47. A method for optimizing post production testing on an integrated circuit device to achieve optimum reliability of the integrated circuit device, the method comprising:
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detecting defects, defective cells or active elements containing defective cells within the integrated circuit device; counting a number of the defects, defective cells or active elements containing defective cells; and determining a minimum amount of post production testing required on the integrated circuit device to achieve a pre-determined measure of reliability of the integrated circuit device, the determining based upon the number of defects, defective cells or active elements containing defective cells compared against one or more preset, normalized numbers. - View Dependent Claims (48, 49, 50, 51, 52)
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Specification