Methods and Systems for Automatic Accommodation of Multiple Measurement Types by Shared Acquisition Hardware

• US 20080281560A1
• Filed: 11/03/2006
• Published: 11/13/2008
• Est. Priority Date: 11/04/2005
• Status: Abandoned Application

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: He, Yi, Engholm, Kathryn A., Bryant, Craig D.
• Application Number:
  US12/092,566
• Publication Number:
  US 20080281560A1
• Time in Patent Office: Days
• US Class Current: 702/189
• CPC Class Codes: G01R 13/0272 for sampling
• CPC Class Codes: G01R 13/029 Software therefor

Abstract

Embodiments of the present invention comprise systems and methods for determining measurement apparatus acquisition parameters and related processing.

Claims

1. An apparatus for determining measurement acquisition parameters, said apparatus comprising:

a) an interface for receiving a first measurement selection and a second measurement selection; and

b) a processor for determining acquisition parameters for an acquisition module, wherein said acquisition parameters may be used to configure said acquisition module to acquire a source data set that accommodates said first measurement and said second measurement.

2. An apparatus as described in claim 1 further comprising said acquisition module.

3. An apparatus as described in claim 1 further comprising a measurement adaptability module.

4. An apparatus as described in claim 1 further comprising a measurement priority module.

5. An apparatus as described in claim 1 wherein at least one of said acquisition parameters is selected from the set consisting of:

sampling rate, length of acquisition, acquisition frequency range, reference level, dither settings, number of samples, filtering and correction parameters, input source selection, and signal path gain and attenuation settings.

6. An apparatus as described in claim 1 wherein said interface may also receive measurement adaptability data and wherein said measurement adaptability data may be used as a factor in said determining acquisition parameters.

7. An apparatus as described in claim 1 wherein said interface may also receive measurement priority data and wherein said measurement priority data may be used as a factor in said determining acquisition parameters.

8. An apparatus as described in claim 1 further comprising processing said source data set to accommodate said second measurement.

9. A method for automatically determining measurement device acquisition parameters, said method comprising:

a) receiving a first measurement selection;

b) receiving a second measurement selection;

c) determining acquisition parameters for an acquisition module, wherein said acquisition parameters may be used to configure said acquisition module to acquire a source data set that accommodates said first measurement and said second measurement.

10. A method as described in claim 9 further comprising receiving measurement adaptability data, wherein said measurement adaptability data is used in said determining acquisition parameters.

11. A method as described in claim 9 further comprising receiving measurement priority data, wherein said measurement priority data is used in said determining acquisition parameters.

12. A method as described in claim 9 wherein at least one of said acquisition parameters is selected from the set consisting of:

sampling rate, length of acquisition, acquisition frequency range, reference level, dither settings, number of samples, filtering and correction parameters, input source selection, and signal path gain and attenuation settings.

13. A method as described in claim 9 further comprising processing said data set to accommodate said second measurement.

14. An apparatus for determining measurement acquisition parameters, said apparatus comprising:

a) an interface for receiving a first measurement selection and a second measurement selection;

b) adaptability storage for storing measurement adaptability data;

c) an acquisition parameter determination module for determining acquisition parameters for an acquisition module, wherein said acquisition parameters may be used to configure said acquisition module to acquire a source data set that accommodates said first measurement and said second measurement; and

d) a processor for processing said source data set to meet conditions of at least one of said first measurement and said second measurement.

15. An apparatus as described in claim 14 further comprising an acquisition module.

16. An apparatus as described in claim 14 wherein at least one of said acquisition parameters is selected from the set consisting of:

sampling rate, length of acquisition, acquisition frequency range, dither settings, number of samples, filtering and correction parameters, input source selection, reference level and signal path gain and attenuation settings.

17. An apparatus as described in claim 14 wherein said interface may also receive measurement adaptability data and wherein said measurement adaptability data may be stored in said adaptability storage and used as a factor in said determining acquisition parameters.

18. An apparatus as described in claim 14 further comprising priority storage for storing measurement priority data, wherein said interface may also receive measurement priority data and wherein said measurement priority data may be stored in said priority storage and used as a factor in said determining acquisition parameters.

19. An apparatus as described in claim 14 wherein said determining acquisition parameters considers the effect of processing acquired source data.

20. An apparatus as described in claim 14 wherein said acquisition parameter determination module outputs a conflict message when acquisition parameters that accommodate said first measurement and said second measurement cannot be determined.

21. An apparatus for accommodating multiple measurements from a single data set, said apparatus comprising:

a) an interface for receiving first measurement configuration data for a first measurement and second measurement configuration data for a second measurement;

b) a receiver for receiving a source data set; and

c) a processor for processing said source data set to accommodate one of said first measurement and said second measurement that is not directly accommodated by said source data set.