×

MEMORY DEVICE AND BUILT IN SELF-TEST METHOD OF THE SAME

  • US 20080282119A1
  • Filed: 10/23/2007
  • Published: 11/13/2008
  • Est. Priority Date: 10/24/2006
  • Status: Abandoned Application
First Claim
Patent Images

1. A memory device comprising:

  • a nonvolatile memory which stores a step item, a parameter start address, and a parameter which has an address corresponding to the parameter start address and defines the step item; and

    a controller which performs, on the nonvolatile memory, a test step corresponding to the step item defined by the parameter, the controller being formed in the same chip as the nonvolatile memory.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×