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Automated Diagnosis for Electronic Systems

  • US 20080288821A1
  • Filed: 06/16/2008
  • Published: 11/20/2008
  • Est. Priority Date: 06/30/2003
  • Status: Abandoned Application
First Claim
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1. A method for providing automated diagnosis of problems for an electronic system, comprising:

  • identifying recent configuration changes made to the electronic system that fall within pre-established parameters;

    ranking the identified changes into potential causes;

    verifying ranked potential causes to determine whether any of the ranked potential causes may be an actual cause or contributor to the problem; and

    calculating distances associated with the ranked potential causes that correspond to a relative likelihood that potential causes may be a true cause.

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