Sensing Apparatus for Detecting an Interface Between First and Second Strata of Materials

• US 20080297159A1
• Filed: 09/02/2005
• Published: 12/04/2008
• Est. Priority Date: 09/10/2004
• Status: Abandoned Application

• Current Assignee: E. I. du Pont de Nemours and Company (Corteva, Inc.)
• Original Assignee: E. I. du Pont de Nemours and Company (Corteva, Inc.)
• Inventors: Mehdizadeh, Mehrdad
• Application Number:
  US11/661,894
• Publication Number:
  US 20080297159A1
• Time in Patent Office: Days
• US Class Current: 324/333
• CPC Class Codes: G01F 23/284 Electromagnetic waves

Abstract

A sensing apparatus for detecting an interface between first and second materials, each have a different dielectric loss factor, disposed in a stratified manner in a volume of materials having a predetermined depth comprises a length of transmission line having an inner conductor surrounded by a dielectric material and a shielding conductor. The transmission line may be coaxial or planar in form.

The transmission line of the sensing apparatus has a predetermined number of sublengths of inner conductor exposed along the length of the transmission line. Adjacent sublengths of exposed inner conductor are separated by shielded sublengths. The exposed sublengths of inner conductor may be bare or surrounded by the dielectric layer.

In use, the sensing apparatus having the exposed sublengths of inner conductor is excited by a radio frequency signal at a predetermined amplitude and is inserted into the volume of material. The total attenuation in amplitude or the change in attenuation is proportional to the number of exposed inner conductor sublengths (i.e., total length of the inner conductor) exposed to the first material and provides an indication as to the location of the interface between the first material and the second material.

Claims

1. A sensing apparatus for detecting an interface defined between a first material and a second material disposed in a stratified manner in a volume of materials, the first material having a first dielectric loss factor and the second material having a second, different, dielectric loss factor,

the sensing apparatus comprising:

a length of transmission line having an inner conductor surrounded by a dielectric material and having at least one shielding conductor,

a predetermined number of sublengths of the inner conductor being exposed along the length of the transmission line so that adjacent sublengths of the exposed inner conductor are separated by shielded sublengths of the transmission line,

whereby, in use, when the transmission line is excited by a radio frequency signal from the source at a predetermined amplitude and is inserted into the volume,

the total attenuation or changes therein provide an indication as to the location of the interface between the first material and the second material.

2. The sensing apparatus of claim 1 wherein the transmission line is a coaxial transmission line.

3. The sensing apparatus of claim 1 wherein the sublengths of exposed inner conductor are collinear with the shielded sublengths of the transmission line.

4. The sensing apparatus of claim 1 wherein the transmission line is a planar transmission line having an inner conductor surrounded by a dielectric material sandwiched between a first shielding conductor layer and a second shielding conductor layer, and wherein

each exposed sublength of the inner conductor is defined by the absence of the one of the shielding layers.

5. The sensing apparatus of claim 4 wherein

each exposed sublength of the inner conductor is defined by the absence of both of the shielding layers.

6. The sensing apparatus of claim 1 wherein the length of transmission line is linear.

7. The sensing apparatus of claim 1 wherein the sublengths of exposed inner conductor are in the form of loops.

8. The sensing apparatus of claim 1 wherein the length of transmission line is helical.

9. The sensing apparatus of claim 8 wherein the sublengths of exposed inner conductor are in the form of loops.

10. The sensing apparatus of claim 1 wherein each exposed sublength of inner conductor is surrounded by the dielectric material.